An experimental study on the variation of MTF and NPS caused by x-ray beam conditions for three indirect digital radiographic imagers

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Issue Date
2006-10-29
Language
ENG
Citation

2006 IEEE Nuclear Science Symposium, Medical Imaging Conference and 15th International Workshop on Room-Temperature Semiconductor X- and Gamma-Ray Detectors, Special Focus Workshops, NSS/MIC/RTSD, pp.1960 - 1963

ISSN
1095-7863
URI
http://hdl.handle.net/10203/143162
Appears in Collection
NE-Conference Papers(학술회의논문)
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