DC Field | Value | Language |
---|---|---|
dc.contributor.author | Jeon, Duk Young | - |
dc.contributor.author | Im, WB | - |
dc.contributor.author | Kim, YI | - |
dc.date.accessioned | 2013-03-18T00:14:41Z | - |
dc.date.available | 2013-03-18T00:14:41Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2005 | - |
dc.identifier.citation | 2005 GIST/KAIST/Kyoto/Tohoku university joint symposium, v., no., pp.32 - | - |
dc.identifier.uri | http://hdl.handle.net/10203/143094 | - |
dc.language | ENG | - |
dc.title | Thermal Stability Study of Eu2+-doped BaAl2Si2O8 Phosphor using its Polymorphism for Plasma Display Panel applications | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 32 | - |
dc.citation.publicationname | 2005 GIST/KAIST/Kyoto/Tohoku university joint symposium | - |
dc.identifier.conferencecountry | South Korea | - |
dc.identifier.conferencecountry | South Korea | - |
dc.contributor.localauthor | Jeon, Duk Young | - |
dc.contributor.nonIdAuthor | Im, WB | - |
dc.contributor.nonIdAuthor | Kim, YI | - |
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