Thermal Noise Modeling for Short - Channel MOSFET's

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dc.contributor.authorLee, Kwyro-
dc.contributor.authorShin, Hyung-Cheol-
dc.contributor.authorHan, Kwangseok-
dc.date.accessioned2013-03-17T10:06:07Z-
dc.date.available2013-03-17T10:06:07Z-
dc.date.created2012-02-06-
dc.date.issued2003-
dc.identifier.citationInternational Conference on Simulation of Semiconductor Processes and Devices(SISPAD), v., no., pp.79 - 82-
dc.identifier.urihttp://hdl.handle.net/10203/142270-
dc.languageENG-
dc.titleThermal Noise Modeling for Short - Channel MOSFET's-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage79-
dc.citation.endingpage82-
dc.citation.publicationnameInternational Conference on Simulation of Semiconductor Processes and Devices(SISPAD)-
dc.identifier.conferencecountryUnited States-
dc.identifier.conferencecountryUnited States-
dc.contributor.localauthorLee, Kwyro-
dc.contributor.localauthorShin, Hyung-Cheol-
dc.contributor.nonIdAuthorHan, Kwangseok-
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EE-Conference Papers(학술회의논문)
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