Thermal Noise Modeling for Short - Channel MOSFET's
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Kwyro | - |
| dc.contributor.author | Shin, Hyung-Cheol | - |
| dc.contributor.author | Han, Kwangseok | - |
| dc.date.accessioned | 2013-03-17T10:06:07Z | - |
| dc.date.available | 2013-03-17T10:06:07Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2003 | - |
| dc.identifier.citation | International Conference on Simulation of Semiconductor Processes and Devices(SISPAD), v., no., pp.79 - 82 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/142270 | - |
| dc.language | ENG | - |
| dc.title | Thermal Noise Modeling for Short - Channel MOSFET's | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 79 | - |
| dc.citation.endingpage | 82 | - |
| dc.citation.publicationname | International Conference on Simulation of Semiconductor Processes and Devices(SISPAD) | - |
| dc.identifier.conferencecountry | United States | - |
| dc.identifier.conferencecountry | United States | - |
| dc.contributor.localauthor | Lee, Kwyro | - |
| dc.contributor.localauthor | Shin, Hyung-Cheol | - |
| dc.contributor.nonIdAuthor | Han, Kwangseok | - |
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