Algorithm for stylus instruments to measure aspheric surfaces
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Park, B.C. | - |
| dc.contributor.author | Lee, Y.W. | - |
| dc.contributor.author | Lee, Chang-Ock | - |
| dc.contributor.author | Park, K. | - |
| dc.date.accessioned | 2013-03-17T09:54:17Z | - |
| dc.date.available | 2013-03-17T09:54:17Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2004-11-08 | - |
| dc.identifier.citation | Optical Design and Testing II, v.5638, no., pp.309 - 318 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/142190 | - |
| dc.language | ENG | - |
| dc.title | Algorithm for stylus instruments to measure aspheric surfaces | - |
| dc.type | Conference | - |
| dc.identifier.scopusid | 2-s2.0-19844369380 | - |
| dc.type.rims | CONF | - |
| dc.citation.volume | 5638 | - |
| dc.citation.beginningpage | 309 | - |
| dc.citation.endingpage | 318 | - |
| dc.citation.publicationname | Optical Design and Testing II | - |
| dc.identifier.conferencecountry | China | - |
| dc.identifier.conferencecountry | China | - |
| dc.contributor.localauthor | Lee, Chang-Ock | - |
| dc.contributor.nonIdAuthor | Park, B.C. | - |
| dc.contributor.nonIdAuthor | Lee, Y.W. | - |
| dc.contributor.nonIdAuthor | Park, K. | - |
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