Electronic structure of bismuth titanate-base films Bi4-xRxTi3O12 dependence on substitution atom
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | No, Kwangsoo | ko |
| dc.contributor.author | Kim, Yun Seok | ko |
| dc.contributor.author | Kim, Yang Soo | ko |
| dc.contributor.author | Kim, Sung Kwan | ko |
| dc.contributor.author | Jeon, Young-Ah | ko |
| dc.date.accessioned | 2013-03-17T09:46:48Z | - |
| dc.date.available | 2013-03-17T09:46:48Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2005-04-18 | - |
| dc.identifier.citation | The 17th International Symposium on Integrated Ferroelectrics (ISIF2005), pp.0 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/142146 | - |
| dc.language | English | - |
| dc.publisher | The 17th International Symposium on Integrated Ferroelectrics (ISIF2005) | - |
| dc.title | Electronic structure of bismuth titanate-base films Bi4-xRxTi3O12 dependence on substitution atom | - |
| dc.type | Conference | - |
| dc.identifier.scopusid | 2-s2.0-33645514687 | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 0 | - |
| dc.citation.endingpage | 0 | - |
| dc.citation.publicationname | The 17th International Symposium on Integrated Ferroelectrics (ISIF2005) | - |
| dc.identifier.conferencecountry | CC | - |
| dc.contributor.localauthor | No, Kwangsoo | - |
| dc.contributor.nonIdAuthor | Kim, Yun Seok | - |
| dc.contributor.nonIdAuthor | Kim, Yang Soo | - |
| dc.contributor.nonIdAuthor | Kim, Sung Kwan | - |
| dc.contributor.nonIdAuthor | Jeon, Young-Ah | - |
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