DC Field | Value | Language |
---|---|---|
dc.contributor.author | Gweon, Dae-Gab | - |
dc.contributor.author | Kim, TJ | - |
dc.contributor.author | Lee, SW | - |
dc.date.accessioned | 2013-03-17T09:34:47Z | - |
dc.date.available | 2013-03-17T09:34:47Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2004-11-03 | - |
dc.identifier.citation | 2nd International Symposium on Nano-manufacturing, v., no., pp.527 - 529 | - |
dc.identifier.uri | http://hdl.handle.net/10203/142080 | - |
dc.language | ENG | - |
dc.title | High Precision Measurement of 3D Profile Using Confocal Differential Heterodyne Interferometer | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 527 | - |
dc.citation.endingpage | 529 | - |
dc.citation.publicationname | 2nd International Symposium on Nano-manufacturing | - |
dc.identifier.conferencecountry | South Korea | - |
dc.identifier.conferencecountry | South Korea | - |
dc.contributor.localauthor | Gweon, Dae-Gab | - |
dc.contributor.nonIdAuthor | Kim, TJ | - |
dc.contributor.nonIdAuthor | Lee, SW | - |
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