DSpace at KOASAS
College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

Electrical evaluation of laser annealed junctions by Hall measurementElectrical evaluation of laser annealed junctions by Hall measurement

Cited 0 time in webofscience Cited 0 time in scopus
  • Hit : 310
  • Download : 0
Export
DC FieldValueLanguage
dc.contributor.authorCho, Byung Jin-
dc.contributor.authorPoon, DCH-
dc.contributor.authorTan, LS-
dc.contributor.authorBhat, M-
dc.contributor.authorChan, L-
dc.date.accessioned2013-03-17T08:47:24Z-
dc.date.available2013-03-17T08:47:24Z-
dc.date.created2012-02-06-
dc.date.issued2003-12-11-
dc.identifier.citation2nd International Conference on Materials for Advanced Technologies, v., no., pp.578 - 578-
dc.identifier.urihttp://hdl.handle.net/10203/141739-
dc.languageENG-
dc.titleElectrical evaluation of laser annealed junctions by Hall measurement-
dc.title.alternativeElectrical evaluation of laser annealed junctions by Hall measurement-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage578-
dc.citation.endingpage578-
dc.citation.publicationname2nd International Conference on Materials for Advanced Technologies-
dc.identifier.conferencecountrySingapore-
dc.identifier.conferencecountrySingapore-
dc.contributor.localauthorCho, Byung Jin-
dc.contributor.nonIdAuthorPoon, DCH-
dc.contributor.nonIdAuthorTan, LS-
dc.contributor.nonIdAuthorBhat, M-
dc.contributor.nonIdAuthorChan, L-
Appears in Collection
EE-Conference Papers(학술회의논문)
Files in This Item
There are no files associated with this item.

Display Simple Item Record

qr_code

  • mendeley

    citeulike

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.


rss_1.0 rss_2.0 atom_1.0