DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Seung-Woo | - |
dc.contributor.author | Kim B.-C. | - |
dc.date.accessioned | 2013-03-17T08:24:20Z | - |
dc.date.available | 2013-03-17T08:24:20Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2003-08-03 | - |
dc.identifier.citation | Optical Diagnostics for Fluids, Solids, and Combustion II, v.5191, no., pp.200 - 207 | - |
dc.identifier.uri | http://hdl.handle.net/10203/141560 | - |
dc.language | ENG | - |
dc.title | Point-Diffraction Interferometer for 3-D Profile Measurement of Rough Surfaces | - |
dc.type | Conference | - |
dc.identifier.scopusid | 2-s2.0-2342595815 | - |
dc.type.rims | CONF | - |
dc.citation.volume | 5191 | - |
dc.citation.beginningpage | 200 | - |
dc.citation.endingpage | 207 | - |
dc.citation.publicationname | Optical Diagnostics for Fluids, Solids, and Combustion II | - |
dc.identifier.conferencecountry | United States | - |
dc.identifier.conferencecountry | United States | - |
dc.contributor.localauthor | Kim, Seung-Woo | - |
dc.contributor.nonIdAuthor | Kim B.-C. | - |
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