DC Field | Value | Language |
---|---|---|
dc.contributor.author | Woo, Seong-Ihl | - |
dc.contributor.author | Kim, TS | - |
dc.contributor.author | Kim, KW | - |
dc.contributor.author | Jeon, MK | - |
dc.date.accessioned | 2013-03-17T07:49:11Z | - |
dc.date.available | 2013-03-17T07:49:11Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2004-12-01 | - |
dc.identifier.citation | The 17th Symposium on Chemical Engineering Kyushu(Japan)-Daejeon/Chungnam(Korea), v., no., pp.0 - 0 | - |
dc.identifier.uri | http://hdl.handle.net/10203/141281 | - |
dc.language | ENG | - |
dc.title | Characterization of vanadium-doped bistmuth titanate thin films according to various amount of doping ion by Liquid Source Misted Chemical Deposition | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 0 | - |
dc.citation.endingpage | 0 | - |
dc.citation.publicationname | The 17th Symposium on Chemical Engineering Kyushu(Japan)-Daejeon/Chungnam(Korea) | - |
dc.identifier.conferencecountry | Japan | - |
dc.identifier.conferencecountry | Japan | - |
dc.contributor.localauthor | Woo, Seong-Ihl | - |
dc.contributor.nonIdAuthor | Kim, TS | - |
dc.contributor.nonIdAuthor | Kim, KW | - |
dc.contributor.nonIdAuthor | Jeon, MK | - |
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