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College of Engineering(공과대학)Dept. of Materials Science and Engineering(신소재공학과)MS-Conference Papers(학술회의논문)

Analysis of field emission operation-induced defects in carbon nanotube via a combination of field emission measurement and Raman spectroscopy

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dc.contributor.authorLee, Y-
dc.contributor.authorLee, S-
dc.contributor.authorJeon, Duk Young-
dc.date.accessioned2013-03-17T07:04:13Z-
dc.date.available2013-03-17T07:04:13Z-
dc.date.created2012-02-06-
dc.date.issued2006-07-17-
dc.identifier.citation19th International Vacuum Nanoelecronics Conference and 50th International Field Emission Symposium, IVNC and IFES 2006, v., no., pp.79 - 80-
dc.identifier.urihttp://hdl.handle.net/10203/140931-
dc.languageENG-
dc.titleAnalysis of field emission operation-induced defects in carbon nanotube via a combination of field emission measurement and Raman spectroscopy-
dc.typeConference-
dc.identifier.scopusid2-s2.0-48649099732-
dc.type.rimsCONF-
dc.citation.beginningpage79-
dc.citation.endingpage80-
dc.citation.publicationname19th International Vacuum Nanoelecronics Conference and 50th International Field Emission Symposium, IVNC and IFES 2006-
dc.identifier.conferencecountryChina-
dc.identifier.conferencecountryChina-
dc.contributor.localauthorJeon, Duk Young-
dc.contributor.nonIdAuthorLee, Y-
dc.contributor.nonIdAuthorLee, S-
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MS-Conference Papers(학술회의논문)
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