DC Field | Value | Language |
---|---|---|
dc.contributor.author | Yoo, Hoi-Jun | - |
dc.date.accessioned | 2013-03-17T05:53:05Z | - |
dc.date.available | 2013-03-17T05:53:05Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2004-09 | - |
dc.identifier.citation | IEEE SOCC 2004, v., no., pp.223 - 226 | - |
dc.identifier.uri | http://hdl.handle.net/10203/140414 | - |
dc.language | ENG | - |
dc.publisher | IEEE | - |
dc.title | On Chip Network Based Embedded Core Testing | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 223 | - |
dc.citation.endingpage | 226 | - |
dc.citation.publicationname | IEEE SOCC 2004 | - |
dc.contributor.localauthor | Yoo, Hoi-Jun | - |
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