Cell Deformability Monitoring Chips Based on Orifice-Length-Dependent Lysis Rates
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Youn, Sechan | - |
| dc.contributor.author | Yi, Soyeon | - |
| dc.contributor.author | Cho, Young-Ho | - |
| dc.date.accessioned | 2013-03-17T05:40:26Z | - |
| dc.date.available | 2013-03-17T05:40:26Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2005-11-16 | - |
| dc.identifier.citation | The 9th Annual European Conf. on Micro, v., no., pp. - | - |
| dc.identifier.uri | http://hdl.handle.net/10203/140337 | - |
| dc.language | ENG | - |
| dc.title | Cell Deformability Monitoring Chips Based on Orifice-Length-Dependent Lysis Rates | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | The 9th Annual European Conf. on Micro | - |
| dc.identifier.conferencecountry | Switzerland | - |
| dc.identifier.conferencecountry | Switzerland | - |
| dc.contributor.localauthor | Cho, Young-Ho | - |
| dc.contributor.nonIdAuthor | Youn, Sechan | - |
| dc.contributor.nonIdAuthor | Yi, Soyeon | - |
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