DC Field | Value | Language |
---|---|---|
dc.contributor.author | Le, V.H. | - |
dc.contributor.author | Tran, Q.K. | - |
dc.contributor.author | Han, S.K. | - |
dc.contributor.author | Lee, Sang-Gug | - |
dc.date.accessioned | 2013-03-17T05:26:51Z | - |
dc.date.available | 2013-03-17T05:26:51Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2005-12-19 | - |
dc.identifier.citation | 2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC, v., no., pp.461 - 464 | - |
dc.identifier.uri | http://hdl.handle.net/10203/140224 | - |
dc.language | ENG | - |
dc.title | Characterization of lo leakage behavior in transconductance mixers | - |
dc.type | Conference | - |
dc.identifier.scopusid | 2-s2.0-43549101659 | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 461 | - |
dc.citation.endingpage | 464 | - |
dc.citation.publicationname | 2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC | - |
dc.contributor.localauthor | Lee, Sang-Gug | - |
dc.contributor.nonIdAuthor | Le, V.H. | - |
dc.contributor.nonIdAuthor | Tran, Q.K. | - |
dc.contributor.nonIdAuthor | Han, S.K. | - |
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