Low coherence interferometry for 3-D measurements of microelectronics packaging and integration
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Seung-Woo | - |
| dc.contributor.author | Ghim Y.-S. | - |
| dc.date.accessioned | 2013-03-17T04:20:58Z | - |
| dc.date.available | 2013-03-17T04:20:58Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2004-11-08 | - |
| dc.identifier.citation | Optoelectronic Devices and Integration, v.5644, no., pp.429 - 443 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/139785 | - |
| dc.language | ENG | - |
| dc.title | Low coherence interferometry for 3-D measurements of microelectronics packaging and integration | - |
| dc.type | Conference | - |
| dc.identifier.scopusid | 2-s2.0-20044395294 | - |
| dc.type.rims | CONF | - |
| dc.citation.volume | 5644 | - |
| dc.citation.beginningpage | 429 | - |
| dc.citation.endingpage | 443 | - |
| dc.citation.publicationname | Optoelectronic Devices and Integration | - |
| dc.identifier.conferencecountry | China | - |
| dc.identifier.conferencecountry | China | - |
| dc.contributor.localauthor | Kim, Seung-Woo | - |
| dc.contributor.nonIdAuthor | Ghim Y.-S. | - |
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