Low coherence interferometry for 3-D measurements of microelectronics packaging and integration

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dc.contributor.authorKim, Seung-Woo-
dc.contributor.authorGhim Y.-S.-
dc.date.accessioned2013-03-17T04:20:58Z-
dc.date.available2013-03-17T04:20:58Z-
dc.date.created2012-02-06-
dc.date.issued2004-11-08-
dc.identifier.citationOptoelectronic Devices and Integration, v.5644, no., pp.429 - 443-
dc.identifier.urihttp://hdl.handle.net/10203/139785-
dc.languageENG-
dc.titleLow coherence interferometry for 3-D measurements of microelectronics packaging and integration-
dc.typeConference-
dc.identifier.scopusid2-s2.0-20044395294-
dc.type.rimsCONF-
dc.citation.volume5644-
dc.citation.beginningpage429-
dc.citation.endingpage443-
dc.citation.publicationnameOptoelectronic Devices and Integration-
dc.identifier.conferencecountryChina-
dc.identifier.conferencecountryChina-
dc.contributor.localauthorKim, Seung-Woo-
dc.contributor.nonIdAuthorGhim Y.-S.-
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ME-Conference Papers(학술회의논문)
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