Cavity-Q measurements of silica microsphere with nanocrystal Si active layer
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Sung, J.-Y. | - |
| dc.contributor.author | Shin, JungHoon | - |
| dc.contributor.author | Tewari, A. | - |
| dc.contributor.author | Brongersma, M. | - |
| dc.date.accessioned | 2013-03-17T03:27:20Z | - |
| dc.date.available | 2013-03-17T03:27:20Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2005-09-21 | - |
| dc.identifier.citation | 2005 IEEE International Conference on Group IV Photonics, v.2005, no., pp.102 - 104 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/139397 | - |
| dc.language | ENG | - |
| dc.title | Cavity-Q measurements of silica microsphere with nanocrystal Si active layer | - |
| dc.type | Conference | - |
| dc.identifier.scopusid | 2-s2.0-33746786428 | - |
| dc.type.rims | CONF | - |
| dc.citation.volume | 2005 | - |
| dc.citation.beginningpage | 102 | - |
| dc.citation.endingpage | 104 | - |
| dc.citation.publicationname | 2005 IEEE International Conference on Group IV Photonics | - |
| dc.identifier.conferencecountry | Belgium | - |
| dc.identifier.conferencecountry | Belgium | - |
| dc.contributor.localauthor | Shin, JungHoon | - |
| dc.contributor.nonIdAuthor | Sung, J.-Y. | - |
| dc.contributor.nonIdAuthor | Tewari, A. | - |
| dc.contributor.nonIdAuthor | Brongersma, M. | - |
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