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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

On-chip network based embedded core testing

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dc.contributor.authorKim, J.-S.ko
dc.contributor.authorHwang, M.-S.ko
dc.contributor.authorRoh, S.ko
dc.contributor.authorLee, J.-Y.ko
dc.contributor.authorLee, K.ko
dc.contributor.authorLee, S.-J.ko
dc.contributor.authorYoo, Hoi-Junko
dc.date.accessioned2013-03-17T03:18:46Z-
dc.date.available2013-03-17T03:18:46Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2004-09-12-
dc.identifier.citationProceedings - IEEE International SOC Conference, pp.223 - 226-
dc.identifier.urihttp://hdl.handle.net/10203/139329-
dc.languageEnglish-
dc.publisherIEEE-
dc.titleOn-chip network based embedded core testing-
dc.typeConference-
dc.identifier.wosid000224551900059-
dc.identifier.scopusid2-s2.0-14844320794-
dc.type.rimsCONF-
dc.citation.beginningpage223-
dc.citation.endingpage226-
dc.citation.publicationnameProceedings - IEEE International SOC Conference-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationSanta Clara, CA-
dc.contributor.localauthorYoo, Hoi-Jun-
dc.contributor.nonIdAuthorKim, J.-S.-
dc.contributor.nonIdAuthorHwang, M.-S.-
dc.contributor.nonIdAuthorRoh, S.-
dc.contributor.nonIdAuthorLee, J.-Y.-
dc.contributor.nonIdAuthorLee, K.-
dc.contributor.nonIdAuthorLee, S.-J.-
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EE-Conference Papers(학술회의논문)
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