Bilayer Resists Based on Polyhedral Oligomeric Silsesquioxane for Deep-UV Lithography

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Publisher
JSPS, KOSEF
Issue Date
2005-09-30
Language
ENG
Citation

Korea-Japan Young Scientist Symposium on polymers, 2005, pp.0 - 0

URI
http://hdl.handle.net/10203/139213
Appears in Collection
CH-Conference Papers(학술회의논문)
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