DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chu, J | - |
dc.contributor.author | Kim, Seung-Woo | - |
dc.date.accessioned | 2013-03-17T02:39:02Z | - |
dc.date.available | 2013-03-17T02:39:02Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2003-11-27 | - |
dc.identifier.citation | 한국정밀공학회 한일심포지움, v., no., pp.328 - 331 | - |
dc.identifier.uri | http://hdl.handle.net/10203/138972 | - |
dc.language | ENG | - |
dc.title | Volumetric interferometer for nano-scale coordinate metrology | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 328 | - |
dc.citation.endingpage | 331 | - |
dc.citation.publicationname | 한국정밀공학회 한일심포지움 | - |
dc.identifier.conferencecountry | South Korea | - |
dc.identifier.conferencecountry | South Korea | - |
dc.contributor.localauthor | Kim, Seung-Woo | - |
dc.contributor.nonIdAuthor | Chu, J | - |
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