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College of Engineering(공과대학)Dept. of Materials Science and Engineering(신소재공학과)MS-Conference Papers(학술회의논문)

Observation of Ge2Sb2Te5 thin film phase transition behavior according to the number of cycles using transmission electron microscope and scanning probe microscope

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Kim, H / Choi, Si-Kyung researcher / Kang,S / Oh, K. / Kweon, S

Issue Date: 2006-11-27

Language: ENG

Citation: 2006 MRS Fall Meeting, pp.206 - 212

URI: http://hdl.handle.net/10203/138958

Appears in Collection: MS-Conference Papers(학술회의논문)

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Observation of Ge2Sb2Te5 thin film phase transition behavior according to the number of cycles using transmission electron microscope and scanning probe microscope

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