Measurement of Mechanical Properties of Electroplated Nickel Thin Film for MEMS Application

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dc.contributor.authorBack, DC-
dc.contributor.authorPark, TS-
dc.contributor.authorLee, Soon-Bok-
dc.contributor.authorLee, NK-
dc.contributor.authorChoi, TH-
dc.contributor.authorNa, KH-
dc.date.accessioned2013-03-17T01:46:07Z-
dc.date.available2013-03-17T01:46:07Z-
dc.date.created2012-02-06-
dc.date.issued2003-
dc.identifier.citationKSME 2003 Spring Conference, v., no., pp. --
dc.identifier.urihttp://hdl.handle.net/10203/138507-
dc.languageKOR-
dc.titleMeasurement of Mechanical Properties of Electroplated Nickel Thin Film for MEMS Application-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationnameKSME 2003 Spring Conference-
dc.identifier.conferencecountrySouth Korea-
dc.identifier.conferencecountrySouth Korea-
dc.contributor.localauthorLee, Soon-Bok-
dc.contributor.nonIdAuthorBack, DC-
dc.contributor.nonIdAuthorPark, TS-
dc.contributor.nonIdAuthorLee, NK-
dc.contributor.nonIdAuthorChoi, TH-
dc.contributor.nonIdAuthorNa, KH-
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ME-Conference Papers(학술회의논문)
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