Inspection system for microelectronics BGA package using wavelength scanning interferometry

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dc.contributor.authorKang C.M.ko
dc.contributor.authorWoo H.G.ko
dc.contributor.authorCho, Hyungsuckko
dc.contributor.authorHahn J.W.ko
dc.contributor.authorLee J.Y.ko
dc.date.accessioned2007-09-10T06:39:15Z-
dc.date.available2007-09-10T06:39:15Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2001-10-29-
dc.identifier.citationOptomechatronic Systems II, pp.74 - 85-
dc.identifier.urihttp://hdl.handle.net/10203/1382-
dc.descriptionCopyright (2001) Society of Photo-Optical Instrumentation Engineers.en
dc.languageEnglish-
dc.language.isoen_USen
dc.publisherInternational Society for Optical Engineering (SPIE)-
dc.titleInspection system for microelectronics BGA package using wavelength scanning interferometry-
dc.typeConference-
dc.identifier.wosid000173561500008-
dc.identifier.scopusid2-s2.0-0035766143-
dc.type.rimsCONF-
dc.citation.beginningpage74-
dc.citation.endingpage85-
dc.citation.publicationnameOptomechatronic Systems II-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationNewton-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.contributor.localauthorCho, Hyungsuck-
dc.contributor.nonIdAuthorKang C.M.-
dc.contributor.nonIdAuthorWoo H.G.-
dc.contributor.nonIdAuthorHahn J.W.-
dc.contributor.nonIdAuthorLee J.Y.-
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