The dependence of the preferred orientation and piezoelectric property of Pb(Zr0.52,Ti0.48)O3 (PZT) thin film on the deposition temperature

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dc.contributor.authorSong, HW-
dc.contributor.authorShin, H-
dc.contributor.authorNo, Kwangsoo-
dc.date.accessioned2013-03-17T00:51:54Z-
dc.date.available2013-03-17T00:51:54Z-
dc.date.created2012-02-06-
dc.date.issued2001-01-01-
dc.identifier.citation10th International Meeting on Ferroelectrics (IMF-10), v.271, no., pp.27 - 32-
dc.identifier.issn0015-0193-
dc.identifier.urihttp://hdl.handle.net/10203/138027-
dc.languageENG-
dc.titleThe dependence of the preferred orientation and piezoelectric property of Pb(Zr0.52,Ti0.48)O3 (PZT) thin film on the deposition temperature-
dc.typeConference-
dc.identifier.scopusid2-s2.0-0142076691-
dc.type.rimsCONF-
dc.citation.volume271-
dc.citation.beginningpage27-
dc.citation.endingpage32-
dc.citation.publicationname10th International Meeting on Ferroelectrics (IMF-10)-
dc.identifier.conferencecountrySpain-
dc.identifier.conferencecountrySpain-
dc.contributor.localauthorNo, Kwangsoo-
dc.contributor.nonIdAuthorSong, HW-
dc.contributor.nonIdAuthorShin, H-
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MS-Conference Papers(학술회의논문)
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