Analysis of shear force characteristic and piezoelectric tip-sample distance control for NSOM

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Issue Date
1999-06
Language
ENG
Citation

SPIE Conf. on Optical Engineering for Sensing and Nanotechnology, pp.303 - 306

URI
http://hdl.handle.net/10203/137399
Appears in Collection
ME-Conference Papers(학술회의논문)
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