DC Field | Value | Language |
---|---|---|
dc.contributor.author | Sung, Chang Sup | - |
dc.date.accessioned | 2013-03-16T21:24:10Z | - |
dc.date.available | 2013-03-16T21:24:10Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2002 | - |
dc.identifier.citation | International Conference on Modeling and Analysis of Semiconductor Manufacturing, v., no., pp.217 - 222 | - |
dc.identifier.uri | http://hdl.handle.net/10203/136036 | - |
dc.language | ENG | - |
dc.title | Heurisic Algorithm for Minimizing Earliness-Tardiness on a Single Burn-in Oven in Semiconductor Manufacturing. Proceedings of the International Conference on Modeling and Analysis of Semiconductor Manufacturing | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 217 | - |
dc.citation.endingpage | 222 | - |
dc.citation.publicationname | International Conference on Modeling and Analysis of Semiconductor Manufacturing | - |
dc.identifier.conferencecountry | United States | - |
dc.contributor.localauthor | Sung, Chang Sup | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.