Characterization of thin PZT nano films using scanning probe microscope
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | No, Kwangsoo | - |
| dc.date.accessioned | 2013-03-16T20:26:14Z | - |
| dc.date.available | 2013-03-16T20:26:14Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2002-01-01 | - |
| dc.identifier.citation | International Symposium on Nanobioscience, v., no., pp. - | - |
| dc.identifier.uri | http://hdl.handle.net/10203/135474 | - |
| dc.language | ENG | - |
| dc.title | Characterization of thin PZT nano films using scanning probe microscope | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | International Symposium on Nanobioscience | - |
| dc.contributor.localauthor | No, Kwangsoo | - |
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