Fabrication and characterization of PZT thick films on silicon substrates

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dc.contributor.authorNo, Kwangsoo-
dc.contributor.authorJeon, Y-
dc.contributor.authorChung, J-
dc.date.accessioned2013-03-16T20:05:00Z-
dc.date.available2013-03-16T20:05:00Z-
dc.date.created2012-02-06-
dc.date.issued1999-01-01-
dc.identifier.citationThe 2nd International Symposium on Electronic Materials between Korea and Japan, v., no., pp. --
dc.identifier.urihttp://hdl.handle.net/10203/135305-
dc.languageENG-
dc.titleFabrication and characterization of PZT thick films on silicon substrates-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationnameThe 2nd International Symposium on Electronic Materials between Korea and Japan-
dc.contributor.localauthorNo, Kwangsoo-
dc.contributor.nonIdAuthorJeon, Y-
dc.contributor.nonIdAuthorChung, J-
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MS-Conference Papers(학술회의논문)
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