Micromachined picosecond optical near-field probe for purse-coupling measurement of interconnection lines
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Joungho | ko |
| dc.contributor.author | Lee, Jongjoo | ko |
| dc.contributor.author | Lee, Heeseok | ko |
| dc.contributor.author | Baek, Seungyong | ko |
| dc.contributor.author | Jung, Yuchul | ko |
| dc.date.accessioned | 2013-03-16T18:24:02Z | - |
| dc.date.available | 2013-03-16T18:24:02Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2000-10 | - |
| dc.identifier.citation | IEEE 9th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP2000, pp.185 - 188 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/134304 | - |
| dc.language | English | - |
| dc.publisher | IEEE | - |
| dc.title | Micromachined picosecond optical near-field probe for purse-coupling measurement of interconnection lines | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000165999900045 | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 185 | - |
| dc.citation.endingpage | 188 | - |
| dc.citation.publicationname | IEEE 9th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP2000 | - |
| dc.identifier.conferencecountry | US | - |
| dc.identifier.conferencelocation | Phoenix | - |
| dc.contributor.localauthor | Kim, Joungho | - |
| dc.contributor.nonIdAuthor | Lee, Jongjoo | - |
| dc.contributor.nonIdAuthor | Lee, Heeseok | - |
| dc.contributor.nonIdAuthor | Baek, Seungyong | - |
| dc.contributor.nonIdAuthor | Jung, Yuchul | - |
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