A Self-Heating Effect Modeling of GaAs MESFET Using Pulsed I-V Measurement
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 홍성철 | - |
| dc.contributor.author | 고경민 | - |
| dc.contributor.author | 박현민 | - |
| dc.contributor.author | 고상수 | - |
| dc.contributor.author | 김덕환 | - |
| dc.date.accessioned | 2013-03-16T17:42:55Z | - |
| dc.date.available | 2013-03-16T17:42:55Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2001 | - |
| dc.identifier.citation | The 8th Korean Conference on Semiconductors, v., no., pp.273 - 274 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/133883 | - |
| dc.language | KOR | - |
| dc.title | A Self-Heating Effect Modeling of GaAs MESFET Using Pulsed I-V Measurement | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 273 | - |
| dc.citation.endingpage | 274 | - |
| dc.citation.publicationname | The 8th Korean Conference on Semiconductors | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.contributor.localauthor | 홍성철 | - |
| dc.contributor.nonIdAuthor | 고경민 | - |
| dc.contributor.nonIdAuthor | 박현민 | - |
| dc.contributor.nonIdAuthor | 고상수 | - |
| dc.contributor.nonIdAuthor | 김덕환 | - |
- Appears in Collection
- EE-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.