Heuristic Algorithm for Minimizing Earliness-Tardiness on a Single Burn-In Oven in Semiconductor Manufacturing
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Sung, Chang Sup | - |
| dc.date.accessioned | 2013-03-16T17:21:40Z | - |
| dc.date.available | 2013-03-16T17:21:40Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2002 | - |
| dc.identifier.citation | International Conference on Modeling and Analysis of Semiconductor Manufacturing (2002), v., no., pp.1 - 6 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/133696 | - |
| dc.language | ENG | - |
| dc.title | Heuristic Algorithm for Minimizing Earliness-Tardiness on a Single Burn-In Oven in Semiconductor Manufacturing | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 1 | - |
| dc.citation.endingpage | 6 | - |
| dc.citation.publicationname | International Conference on Modeling and Analysis of Semiconductor Manufacturing (2002) | - |
| dc.identifier.conferencecountry | United States | - |
| dc.identifier.conferencecountry | United States | - |
| dc.contributor.localauthor | Sung, Chang Sup | - |
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