Improved Phase Unwrapping of Phase Shift Interferometer using Precision XY-Scanner
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Park, S-L | ko |
| dc.contributor.author | Moon, K-S | ko |
| dc.contributor.author | Gweon, Dae-Gab | ko |
| dc.date.accessioned | 2013-03-16T16:57:42Z | - |
| dc.date.available | 2013-03-16T16:57:42Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1999-06 | - |
| dc.identifier.citation | SPIE Conf. on Optical Engineering for Sensing and Nanotechnology, pp.12 - 15 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/133486 | - |
| dc.language | English | - |
| dc.publisher | SPIE | - |
| dc.title | Improved Phase Unwrapping of Phase Shift Interferometer using Precision XY-Scanner | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000083313900003 | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 12 | - |
| dc.citation.endingpage | 15 | - |
| dc.citation.publicationname | SPIE Conf. on Optical Engineering for Sensing and Nanotechnology | - |
| dc.identifier.conferencecountry | JA | - |
| dc.identifier.conferencelocation | Yokohama | - |
| dc.contributor.localauthor | Gweon, Dae-Gab | - |
| dc.contributor.nonIdAuthor | Park, S-L | - |
| dc.contributor.nonIdAuthor | Moon, K-S | - |
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