Analysis of the Stress Generated during Phase Boundary Movement in Pure and Co(OH)2 Incorporated Ni(OH)2 Film Electrodes Using Laser Beam Deflection and Current Transient Techniques
- Issue Date
- 1999
- Language
- KOR
- Citation
The Korean Electrochemical Society, pp.49 - 49
- Appears in Collection
- MS-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
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