Arbitrary N-Step Algorithm for Removal of Higher Order Test Optics Errors
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Seung-Woo | ko |
| dc.contributor.author | Rhee, HG | ko |
| dc.contributor.author | Kim, BC | ko |
| dc.date.accessioned | 2013-03-16T14:28:13Z | - |
| dc.date.available | 2013-03-16T14:28:13Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1999-11 | - |
| dc.identifier.citation | Proceedings of ASPE 1999 Annual Meeting, pp.433 - 436 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/132160 | - |
| dc.language | English | - |
| dc.publisher | ASPE | - |
| dc.title | Arbitrary N-Step Algorithm for Removal of Higher Order Test Optics Errors | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000168480400103 | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 433 | - |
| dc.citation.endingpage | 436 | - |
| dc.citation.publicationname | Proceedings of ASPE 1999 Annual Meeting | - |
| dc.identifier.conferencecountry | US | - |
| dc.identifier.conferencelocation | Monterey, California | - |
| dc.contributor.localauthor | Kim, Seung-Woo | - |
| dc.contributor.nonIdAuthor | Rhee, HG | - |
| dc.contributor.nonIdAuthor | Kim, BC | - |
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