DC Field | Value | Language |
---|---|---|
dc.contributor.author | Park, Sang Chan | - |
dc.date.accessioned | 2013-03-16T13:08:08Z | - |
dc.date.available | 2013-03-16T13:08:08Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1999 | - |
dc.identifier.citation | Int'l Conf. on Production Research, v., no., pp.1219 - 1222 | - |
dc.identifier.uri | http://hdl.handle.net/10203/131590 | - |
dc.language | ENG | - |
dc.title | Machine Learning Approach to Yield Management in Semiconductor Manufacturing: Continuous Class Learning Approaches | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 1219 | - |
dc.citation.endingpage | 1222 | - |
dc.citation.publicationname | Int'l Conf. on Production Research | - |
dc.identifier.conferencecountry | Ireland | - |
dc.identifier.conferencecountry | Ireland | - |
dc.contributor.localauthor | Park, Sang Chan | - |
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