Investigation of quasi-breakdown mechanism in ultrathin gate oxidesInvestigation of quasi-breakdown mechanism in ultrathin gate oxides
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Cho, Byung Jin | - |
| dc.contributor.author | He, YD | - |
| dc.contributor.author | Guan, H | - |
| dc.contributor.author | Li, MF | - |
| dc.contributor.author | Dong, Z | - |
| dc.date.accessioned | 2013-03-16T10:34:17Z | - |
| dc.date.available | 2013-03-16T10:34:17Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1999-11-29 | - |
| dc.identifier.citation | Materials Research Society (MRS) 1999 Fall Meeting Symp. Proc., v., no., pp.0 - 0 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/130411 | - |
| dc.language | ENG | - |
| dc.title | Investigation of quasi-breakdown mechanism in ultrathin gate oxides | - |
| dc.title.alternative | Investigation of quasi-breakdown mechanism in ultrathin gate oxides | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 0 | - |
| dc.citation.endingpage | 0 | - |
| dc.citation.publicationname | Materials Research Society (MRS) 1999 Fall Meeting Symp. Proc. | - |
| dc.identifier.conferencecountry | United States | - |
| dc.identifier.conferencecountry | United States | - |
| dc.contributor.localauthor | Cho, Byung Jin | - |
| dc.contributor.nonIdAuthor | He, YD | - |
| dc.contributor.nonIdAuthor | Guan, H | - |
| dc.contributor.nonIdAuthor | Li, MF | - |
| dc.contributor.nonIdAuthor | Dong, Z | - |
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