Rapid defect inspection of display devices with optical spatial filtering
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Seung-Woo | ko |
| dc.contributor.author | Yoon Dong-Seon | ko |
| dc.date.accessioned | 2013-03-16T09:54:33Z | - |
| dc.date.available | 2013-03-16T09:54:33Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1999-06-16 | - |
| dc.identifier.citation | Proceedings of the 1999 Optical Measurement Systems for Industrial Inspection, pp.255 - 261 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/130080 | - |
| dc.language | English | - |
| dc.publisher | SPIE | - |
| dc.title | Rapid defect inspection of display devices with optical spatial filtering | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000083362500031 | - |
| dc.identifier.scopusid | 2-s2.0-0033355659 | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 255 | - |
| dc.citation.endingpage | 261 | - |
| dc.citation.publicationname | Proceedings of the 1999 Optical Measurement Systems for Industrial Inspection | - |
| dc.identifier.conferencecountry | GE | - |
| dc.identifier.conferencelocation | Munich, Ger | - |
| dc.contributor.localauthor | Kim, Seung-Woo | - |
| dc.contributor.nonIdAuthor | Yoon Dong-Seon | - |
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