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Very Large Scale Phase Measuring Interferometry of Work Surfaces for Diagnostic Analysis of the Diamond Turning Process Kim, Seung-Woo; Kim, D.S.; Chang, I.C.; Keem, T.H.; Yoo, S.B., Proc. of 1st International Conference of the European Society for Precision Engineering and Nanotech, pp.24 - 27, European-Society-for-Precision-Engineering and Nanotechnology, 1999-05 |
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