Browse "Dept. of Mechanical Engineering(기계공학과)" by Author 186

Showing results 1 to 60 of 320

1
2-종모드 레이저의 비트 주파수를 이용한 헤테로다인 간섭계용 광원 개발

김민석; 김승우, 한국광학회 제12회 정기총회 및 2001년도 동계학술발표회 , pp.92 - 93, 한국광학회, 2001-02-15

2
2종모드 레이저를 이용한 고분해능 헤테로다인 간섭계

김민석; 김승우, 한국정밀공학회 2001년도 추계학술대회 , v.1, pp.214 - 219, 한국정밀공학회, 2001

3
2차원 자가보정 알고리즘에서의 불확도 전파

김승우, 한국정밀공학회 춘계학술대회, pp.434 - 437, 2003

4
3-Dimensional Measurement of Surface Profile by Moire Topography

Park, H.G.; Kim, Seung-Woo, Proc. of CIRP Conf. on Precision Engineering and Manufacturing Systems, pp.163 - 172, 1991-11

5
3-Dimensional Measurement of Surface profile by Moire Topography

Kim, Seung-Woo; Park, H.G., Proc. of the Japan-U.S.A. Symposium on Flexible Automation, ISCIE, pp.1083 - 1087, 1992

6
3-dimensional measurement of surface profiles by slit beam scanning topography

Kim, Seung-Woo; Park Hyun-Goo, Proceedings of the 1992 Japan - USA Symposium on Flexible Automation Part 2 (of 2), pp.1083 - 1087, 1992-07-13

7
3D Topographical Measurements of Thin Films by Spectrally-Resolved White-Light Interferometry

Kim, Seung-Woo; Ghim, Y.S., ASPEN 2007, 2007

8
3차원 좌표측정용 부피간섭계

김승우; 이혁교; 주지영, 한국광학회 제13회 정기총회 및 2002년도 동계학술발표회, pp.116 - 117, 한국광학회, 2002-02-19

9
93 대전 엑스포 꿈돌이 조각가로보트의 인물형상 측정 시스템

최이배; 김승우; 박현구; 김문상, 대한기계학회 1994년 춘추학술대회, v.1, no.1, pp.235 - 238, 대한기계학회, 1994

10
A Point-Diffraction Interferometer with Vibration-Desensitizing Capability

Kihm, H; Park, J; Kwon,T; You, JH; Kim, Seung-Woo, SPIE Optics & Photonics, SPIE Optics & Photonics, 2006-08

11
A vacuum-compatible air bearing: Design analysis and optimization

Khim G.H.; Park, C.H.; Lee, H.S.; Kim, Seung-Woo, Key Engineering Materials, pp.37 - 44, 2007

12
A Wide-range Optical Frequency Generator for Absolute Distance Measurement

Jin, J.; Kim, Y.; Hyun, S.; Kim, Seung-Woo, The Third International Conference on Positioning Technology 2008 (ICPT2008), The Third International Conference on Positioning Technology 2008 (ICPT2008), 2008-11

13
Absolute Distance Measurement based on the Optical Comb of a Femtosecond Pulse Laser

Kim, Y.J.; Jin, J.; Kim, Y.; Hyun, S.; Kim, Seung-Woo, The Third International Conference on Positioning Technology 2008 (ICPT2008), The Third International Conference on Positioning Technology 2008 (ICPT2008), 2008-11

14
Absolute distance measurement by adjustable synthetic wavelength dual-comb interferometry

Kim, Seung-Woo; Han, Seongheum; Lee, Joohyung; Lee, Keunwoo; Kim, Seungman; Kim, Young Jin, CLEO, CLEO, 2013-06-10

15
Absolute distance measurement using femtosecond laser

Kim, Seung-Woo; Joo K.-N.; Jin J.; Kim Y.S., Nano- and Micro-Metrology, v.5858, pp.1 - 8, 2005-06-16

16
Absolute Distance Measurement using Frequency Comb of a Femtosecond Laser

Jin, J.; Kim, Y. J.; Kim,Y.; Hyun, S.; Kim, Seung-Woo, EUSPEN 8th International Conference, EUSPEN 8th International Conference, 2008-05

17
Absolute Distance Measurement using Frequency Comb of a Femtosecond Laser

Kim, Seung-Woo, CLEO/QELS Conference 2008, CLEO/QELS Conference 2008, 2008-05-01

18
Absolute Distance Measurement using the Frequency Comb of a Femtosecond Laser

Hyun, S.; Kim, Y.J.; Kim, Y.; Kim, Seung-Woo, Annals of CIRP 2010, CIRP, 2010-08

19
Absolute distance measurements based on the frequency comb of a femtosecond pulse laser

Kim, Seung-Woo, ISMTII2009, ISMTII2009, 2009-07

20
Absolute distance measurements using point-diffracted spherical waves

Chu, J; Kim, Seung-Woo, SPIE Optics & Photonics, SPIE Optics & Photonics, 2006-08-16

21
Absolute distance measurements using point-diffracted spherical waves

Chu J.; Kim, Seung-Woo, Interferometry XIII: Applications, 2007-08-16

22
Absolute Distance Measurements using the Frequency Comb of a Femtosecond Pulse Laser

Hyun, S.; Kim, Y.J.; Chun, B.J.; Kim, Y.; Kim Seung-Woo, International Conference on Positioning Technology (ICPT), KIMM, 2010-11

23
Absolute Distance Measurements using the Frequency Comb of a Femtosecond Pulse Laser

Hyun, S.; Kim, Y.-J.; Kim, Y.; Kim Seung-Woo, EUSPEN, European Society for Precision Enginnering & Nanotechnology, 2010-06

24
Absolute length metrology using a femtosecond pulse laser

Jin, J.; Kim, Y.J.; Kim, Y,; Kim, Seung-Woo, The 2nd International Conference on Positioning Technology,Korea, pp.119 - 121, 2006-12

25
Absolute Length Metrology using a Femtosecond Pulse Laser(II)

Kim,Y.J.; Jin, J.; Kim, Y.; Kim, Seung-Woo, KAIST-NMIJ Joint Workshop 2006 on Precision Metrology, pp.9 -, 2006

26
Active Compensation of Movement Errors of a Machine Axis by Multiple Null-Balancing using Twyman-Green Interferometry

Kim, Seung-Woo; Lee ,H.S., Proc. of the 3rd international Workshop on Advanced Motion Control, pp.689 - 698, 1994

27
Active thermal stabilization of machine structure using the fixed temperature point of gallium

Kim, Seung-Woo, Proc. of 2nd Euspen International Conference, pp.824 - 827, 2001-05-27

28
Adaptive Computerised Numerical Control of Grinding Process for Industrial Applications

Kim, Seung-Woo; Shumsheruddin, A. A, Proceedings 23rd International Machine Tool Design and Research Conference , pp.239 - 246, 1983

29
Adaptive Control of the Cylindrical Grinding Process

Kim, Seung-Woo; Shumsheruddin, A.A., Winter Annual Meeting of the ASME, pp.373 - 387, 1985

30
Advanced optical metrology using ultrashort pluse lasers

Kim, Seung-Woo, International seminar on Computered Aided Tolerencing, 2007

31
Advanced Optical Metrology using Ultrashort Pulse Lasers

Kim, Seung-Woo; Kim,Y.J, The 6th Asia Pacific Laser Symposium (APLS2008), The 6th Asia Pacific Laser Symposium (APLS2008), 2008

32
Advancement of white-light interferometry for 3-D profile metrology of micro-structured surfaces

Kim, Seung-Woo; Ghim, YS, kspe, pp.39 - 46, 2005-10

33
AFM-based nanofabrication with Assistance of Femtosecond pulse laser radiation

Kim, S.; Kim, Seung-Woo, International Conference on nanoscience & Technology, pp.1243 -, 2006

34
AFM을 이용한 3 µm 피치 측정 및 분석

김승철; 진종한; 김승우, 한국정밀공학회 2003년 추계학술대회, v.3, pp.214 - 217, 한국정밀공학회, 2003-10

35
All-fiber-based generation of multi-channel optical frequencies

Chun, BJ; Kim, YJ; Hyun, S; Kim, Y; Kim, Seung-Woo, the 10th International Symposium on Measurement Technology and Intelligent Instruments, International Symposium on Measurement Technology and Intelligent Instruments, 2011-06-29

36
Analysis of additional leakage resulting from the feeding motion of a vacuum-compatible air bearing stage

G.Khim,; C.H.Park,; H.Lee,; Kim, Seung-Woo, The 2nd International Conference on Positioning Technology, pp.160 - 165, 2006-10

37
Axiomatic system design for non-thermal dicing of quartz wafers

Han, SH; Kim,Y; Kim, S; Park, S; Park, J; Kim, Seung-Woo, 6th International Conference on Axiomatic Design, International Conference on Axiomatic Design, 2011-03-30

38
CNC 삼차원측정기 개발사례

김승우, 대한기계학회, pp.4 - 9, 1991

39
Combined optical interferometer for displacement measurement

Joo, KN; Oh, JS; KIM SEUNG WOO, 한국정밀공학회 한일심포지움, pp.324 - 327, 2003-11-27

40
compensation for phasw change on reflection in white-light scanning interferometry

Park, M,C,; Kang, M.G.; Kim, Seung-Woo, SPIE, pp.128 - 135, 2002

41
Compensation of out-of-plane error of XY stage based on self-calibration method

Yoo, S; Kim, Seung-Woo, 한국정밀공학회 한일심포지엄, pp.301 - 307, 2003-11-27

42
Compensation of Parasitic Motion Errors in Translational Stage Based on Twyman-Green Interferometry

Oh, JS; Bae, ED; Kim, Seung-Woo, JSPE, pp.433 - 434, 2004-06

43
Compensation of phase shift upon reflection in white light interferometry

Park, M.C.; Kim, Seung-Woo, Proceedings of ASPE 2000 Annual Meeting, pp.505 - 508, 2000

44
Complete 3-D Self-calibration of Coordinate Measuring Machines

Dang, C.Q.; Lee, H.; Kim, Seung-Woo, The 2nd International Conference on Positioning Technology, pp.106 - 109, 2006

45
Cutting Strengthened Glass by Crack Propagation Using Ultra-short Laser Pulses

Kim, Yunseok; Park, Sanguk; You, Junho; Kim, Seung-Woo, International Symposium on Green Manufacturing and Applications, International Symposium on Green Manufacturing and Applications, 2014-06

46
Design and fabrication of plasmonic nanostructure for high harmonic generation

Kim, Seung-Woo, SPIE Optics & Photonics 2009, SPIE Optics & Photonics 2009, 2009-08-01

47
Design of a Fizeau interferometer and self-calibration of system errors for testing of large optics

Kim, H.Y.; Kim, Seung-Woo; Kim, B.C., Korea-China Joint workshop on design, manufacturing, testing and alignment of large optics, 2001

48
Design of an Ultraprecision Stepping Stage for Lithography of Next Generation Integrated-Circuit Chips

Kim, Seung-Woo; Park, S.H; Lee, C.W., Ultraprecision Manufacturing Engineering 3, pp.39 - 42, 1994

49
Design of non-thermal dicing system for quartz wafers

Han, S; Kim, Y; Kim,YJ; Kim, S; Park, S; Park, J; Kim, Seung-Woo, the10th International Symposium on Measurement Technology and Intelligent Instruments, International Symposium on Measurement Technology and Intelligent Instruments, 2011-06-29

50
Development of Aerostatic Stage for Vacuum Environment The 1st International Conference on Positioning Technology

Kim, Seung-Woo; Kim, K.H.; Lee, H.S., The 1st International Conference on Positioning Technology, pp.477 - 478, 2004

51
Development of Fiber Femtosecond Lasers for Advanced Metrological Space Missions

Kim, Seung-Woo; Kim, Young Jin; Lee, Keunwoo; Han, Seongheum; Jang, Yoonsoo; Jang, Heesuk, CLEO-PR &OECC/PS 2013, CLEO-PR &OECC/PS 2013, 2013-06-30

52
Direct inscription of fiber Bragg grating by high power femtosecond pulse laser

Park, S; Kim,YJ; Kim, Y; Kim, S; Han, S; Kim, Seung-Woo, the 10th International Symposium on Measurement Technology and Intelligent Instruments, International Symposium on Measurement Technology and Intelligent Instruments, 2011-06-29

53
Direct Measurement of Spindle Radial Accuracy by Moire Topography

Kim, Seung-Woo, Proc. of the 7th International Precision Engineering Seminar, pp.441 - 450, 1993-05

54
Dispersive Interferometry A-Challenging Direction for New Optical Metrology

Kim, Seung-Woo; Joo, K.N.; Ghim,Y.S., 5th International Conference on Optics-Photonics Design & Fabrication (ODF'06), pp.309 - 310, 2006-12-06

55
Dispersive interferometry using a femtosecond pulse laser

Joo, KN; Kim, Seung-Woo, KAIST-NMIJ Joint Workshop 2006 on Precision Metrology, pp.13 -, 2006-12

56
Dispersive white-light interferometrt for thin-film thickness profile measurement

Kim, Seung-Woo; Y.S.Ghim, SPIE, pp.419 - 426, 2005

57
Dispersive white-light interferometry for 3-D inspection of thin-film layers of flat panel displays

Kim, Seung-Woo; Y.S.Ghim; J.You, Proc.of SPIE, pp.6616 -, 2007

58
Dispersive White-light Interferometry for 3-D Inspection of Thin-Film Layers of Flat Panel Displays

Ghi, YS; Park, J; Kim, Seung-Woo, Proceedings of the 6th euspen International Conference, pp.0 - 0, 2006-05

59
Dispersive white-light interferometry for thin-film thickness profile measurements

Ghim, Y.S.; Kim, Seung-Woo, KAIST-NMIJ Joint Workshop 2006 on Precision Metrology, pp.22 -, 2006-12

60
Distance Metrology for Space Missions using Femtosecond Laser Pulses

Kim, Y.J.; Kim,Y.; Lee, J.; Hyun, S.; Chun, B.J.; Kim, S.; Lee, K.; et al, EOS (European Optical Society) Annual Meeting 2010, EOS (European Optical Society) Annual Meeting 2010, 2010-10

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