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Optical inspection of complex patterns of microelectronics products You, J.; Kim, Seung-Woo, CIRP ANNALS-MANUFACTURING TECHNOLOGY, v.57, no.1, pp.505 - 508, 2008 |
X선 영상을 이용한 물체의 삼차원 형상 복원 및 측정 = Three dimensional volume reconstruction and shape measurement of objects using X-ray imaging techniquelink 노영준; Roh, Young-Jun; et al, 한국과학기술원, 2003 |
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