Showing results 1 to 2 of 2
A control method to reduce the standard deviation of flow time in wafer fabrication Yoon, HJ; Lee, Doo Yong, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.13, no.3, pp.389 - 392, 2000-08 |
Markov-Based Maintenance Planning Considering Repair Time and Periodic Inspection Lee, Seungchul; Li, Lin; Ni, Jun, JOURNAL OF MANUFACTURING SCIENCE AND ENGINEERING-TRANSACTIONS OF THE ASME, v.135, no.3, 2013-06 |
Discover