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Angle-resolved annular data acquisition method for microellipsometry Ye, SH; Kim, Soohyun; Kwak, Yoon Keun; Cho, HM; Cho, YJ; Chegal, W, OPTICS EXPRESS, v.15, no.26, pp.18056 - 18065, 2007-12 |
Separation algorithm for a 2D refractive index distribution and thickness profile of a phase object by laser diode-based multiwavelength interferometry Lee, Kwangchun; Ryu, Sung Yoon; Kwak, Yoon Keun; Kim, Soohyun; Lee, Yun Woo, REVIEW OF SCIENTIFIC INSTRUMENTS, v.80, no.5, 2009 |
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