Showing results 1 to 4 of 4
Auto-alignment for incident angle of ellipsometer Park S.; Jung J.; Seo J.; Kang D.; Gweon, Dae-Gab, Optomechatronic Systems II, pp.339 - 347, SPIE, 2001-10-29 |
Design of real-time confocal microscopy using spectral encoding technique and slit aperture Kim J.; Kang D.; Gweon, Dae-Gab; Sohn Y.; Cho H., Optomechatronic Sensors and Instrumentation, v.6049, 2005-12-05 |
Error analysis and tolerance allocation for confocal scanning microscopy, using Monte Carlo method Yoo H.; Kang D.; Lee S.; Lee J.; Gweon, Dae-Gab, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XI, v.5, no.13, pp.242 - 249, 2004-01-27 |
Lateral resolution enhancement in confocal self-interference microscopy Kang D.; Gweon, Dae-Gab, Three- Dimensional and Multidomensional Microscopy: Image Acquisition and Processing XII, v.5701, pp.152 - 163, 2005-01-25 |
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