Showing results 1 to 3 of 3
Absolute distance measurement using femtosecond laser Kim, Seung-Woo; Joo K.-N.; Jin J.; Kim Y.S., Nano- and Micro-Metrology, v.5858, pp.1 - 8, 2005-06-16 |
Dispersive interferometry using femtosecond pulse laser for measuring refractive index and physical thickness of test samples Joo K.-N.; Kim, Seung-Woo, Interferometry XIII: Techniques and Analysis, 123, 2006-08-14 |
Surface metrology of silicon wafers using a femtosecond pulse laser Kwon T.; Joo K.-N.; Kim, Seung-Woo, Interferometry XIV: Techniques and Analysis, 2008-08-11 |
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