Showing results 2 to 2 of 2
Spectrally resolved phase-shifting interference microscopy: technique based on optical coherence tomography for profiling a transparent film on a patterned substrate Debnath, Sanjit K.; Kim, Seung-Woo; Kothiyal, Mahendra P.; Hariharan, Parameswaran, APPLIED OPTICS, v.49, no.34, pp.6624 - 6629, 2010-12 |
Discover