Showing results 117 to 176 of 320
Phase Measuring Volumetric Interferometry for Three-Dimensional Coordinate Metrology Kim, Seung-Woo, Proc. of 2nd Euspen International Conference, Turin, pp.230 - 233, 2001-01-01 |
Phase-measuring volumetric interferometer for three-dimensional coordinate metrology Kim, Seung-Woo; Rhee, H.G.; Chu, J.Y., ASPE Annual Meeting, pp.411 - 414, 2002 |
Phase-shifitng projection moire for out-of-plane displacement measurement Jeong, M.S.; Kim, Seung-Woo, Proceedinfs of SPIE Vol. 4317, pp.170 - 179, 2000 |
Phase-shifting diffraction grating interferometer for testing concave mirrors Hwang T.-J.; Kim, Seung-Woo, Optical Measurement Systems for Industrial Inspection III, v.5144, pp.451 - 459, 2003-06-23 |
Phase-shifting projection moir챕 for out-of-plane displacement measurement Jeong M.-S.; Kim, Seung-Woo, 2nd International Conference on Experimental Mechanics, v.4317, pp.170 - 179, 2000-11-29 |
Pitch measurement and calibration using atomic force microscope Jin, J; Kim, SC; Kim, Seung-Woo, 한국정밀공학회 한일심포지엄, pp.313 - 316, 2003-11-27 |
Plasmonic field enhancement for generating ultrafast extreme-ultraviolet light pulses Kim, Seung-Woo, SPIE 2011 Optics+Photonics, SPIE 2011 Optics+Photonics, 2011-08-21 |
Point diffraction interferometer with vibratinn desensitizing Capability You, J.; Park, J.; Kwon, T.; Khim, H.; Kim, Seung-Woo, KAIST-NMIJ Joint Workshop 2006 on Precision Metrology, pp.29 -, 2006-12 |
Point-diffraction fiber interferometer for vibration desensitization Park J.; Kihm H.; Kim, Seung-Woo, Optical Measurement Systems for Industrial Inspection IV, pp.922 - 929, 2005-06-13 |
Point-Diffraction Interferometer for 3-D Profile Measurement of Rough Surfaces Kim, Seung-Woo; Kim B.-C., Optical Diagnostics for Fluids, Solids, and Combustion II, v.5191, pp.200 - 207, 2003-08-03 |
PRECISE MEASUREMENT OF REFRACTIVE INDEX AND THE THICKNESS OF A MATERIAL BY DISPERSIVE INTERFEROMETRY USING A FEMTOSECOND PULSE LASER Kim, Seung-Woo, KAIST-TIT Student Workshop, KAIST-TIT Student Workshop, 2007-02 |
Precision laser ranging using femtosecond light pulses Kim, Seung-Woo, ISPEMI2011, ISPEMI, 2011-08-07 |
Precision length metrology based on optical frequency synthesizer Jin J.; Kim, Young Jin; Kim Y.; Hyun S.; Kim, Seung-Woo, 2007 Conference on Lasers and Electro-Optics - Pacific Rim, CLEO/PACIFIC RIM, 2007-08-26 |
Precision Length Metrology using an Optical Frequency Generator Kim, Seung-Woo; Jin, J.H.; Kim, Y.J.; Kim, Y.S.; Hyun, S.W., ASPEN 2007, 2007 |
Precision Length Metrology using Optical Comb of the Femtosecond Pulse Laser Kim, Seung-Woo, ROK-PRC Optics Technology Workshop, pp.0 - 0, 2006-03 |
Precision Length Metrology using Optical Frequency Synthesizer Kim, Seung-Woo; J. Jin; Y. J. Kim; Y. Kim; S. Hyun, CLEO-PR(Pacific Rim), 2007 |
Precision Length Metrology using the Optical Comb of Femtosecond Pulse Lasers Kim, Seung-Woo, 2005 Engineering graduated student symposium, pp.37 - 37, 2005-11 |
Precision Length Metrology usting the Optical comb of Femtosecond Pulse Lasers Jin, J; Kim, YJ; Kim, Seung-Woo, nanoengineering symposium 2005, pp.192 - 197, 2005-10-26 |
Precision Measurement of Aspheric Surfaces by Improved Ronchi Test Kim, Seung-Woo; Lee, H.J.; Lim, S.E., Proc. of ASPE 1997 Annual Meeting, 1997 |
Precision Metrology for Space Missions using Femtoseccond Laser Pulses Kim, Seung-Woo, ASPEN 2011, ASPEN, 2011-11-16 |
Precision Profile Measurement of Aspheric Surfaces by Improved Ronchi Test Kim, Seung-Woo, Proc. of ASPE 1997 Annual Meeting, 1997 |
Precision surface profile measurement using femtosecond pulse laser Kim, Seung-Woo, the 10th International Symposium on Measurement Technology and Intelligent Instruments, International Symposium on Measurement Technology and Intelligent Instruments, 2011-06-29 |
Precision surface profile measurements by comb-based multi-wavelength interferometry Kim, Seung-Woo; Choi, Minah; Hyun, Sangwon; Chun, Byung Jae; Kim, Seungman; Kim, Young Jin, CLEO-PR &OECC/PS 2013, CLEO-PR &OECC/PS 2013, 2013-06-30 |
Production Line Inspection of Precision Surfaces by Phase-Shifting Interferometry with Automatic Suppression of Phase Shift Errors Kim, Seung-Woo, Proc. of the 8th International Precision Engineering Seminar, pp.45 - 48, 1995-05-15 |
Rapid pattern inspection of shadow masks by machine vision integrated with Fourier optics Kim, Seung-Woo; Lee Sang-Yoon; Yoon Dong-Seon; Hong Chul-Ki; Hong Ji-Jung, Proceedings of the 1997 Display Manufacturing Technology Conference, pp.19 - 20, 1997-01-29 |
Real time precision measurement of the absolute distances using the multi-channel optical frequency generator Kim, Seung-Woo; Hyun, Sangwon; Kim, Young Jin; Chun, Byung Jae, ASPEN 2013, ASPEN 2013, 2013-11-15 |
Real-time absolute distance measurement using multi-wavelengths referenced to the frequency comb Kim, Seung-Woo, the 10th International Symposium on Measurement Technology and Intelligent Instruments, International Symposium on Measurement Technology and Intelligent Instruments, 2011-06-29 |
Real-time absolute distance measurement using multi-wavelengths referenced to the frequency comb Kim, Seung-Woo; Hyun, Sangwon; Kim, Young Jin; Chun, Byung Jae, ISMTII2013, ISMTII2013, 2013-07-05 |
Real-time Monitoring and Control System for Femtosecond Pulse Lasers Kim, Seung-Woo; Jang, Heesuk; Lee, Keunwoo; Han, Seongheum; Lee, Joohyung; Kim, Young-Jin, CLEO-PR &OECC/PS 2013, CLEO-PR &OECC/PS 2013, 2013-06-30 |
Real-time positioning control by confocal mocroscopy Park, J; Kim, Seung-Woo, The 2nd International Conference on Positioning Technology, pp.53 - 55, 2006-12 |
Research Activities at KAIST on Absolute Distance Measurement using Optical Frequency Synthesizer Kim, Seung-Woo; Jin, J.; Kim,Y. J., HAALDM Workshop 2007, ESA(European Space Agency)-ESTEC, 2007 |
Research Activities at KAIST on Absolute Distance Measurement using Ultrafast Femtosecond Lasers Kim, Seung-Woo; Kim, Y.J.; KIM, Y.; LEE, J.; Hyun, S.; Chun, B.J.; Kim, S.; et al, Workshop on Long Distance Measurement in Air, Workshop on Long Distance Measurement in Air, 2009-10 |
Self-calibration of Coordinate Measuring Machines Yoo, S; Kim, Seung-Woo, Proceeding of the Euspen international topical conference, pp.423 - 426, 2003-05-19 |
Simultaneous Measurement and Compensation of 5-DOF Motion Errors Using Extended Twyman-Green Interferometry Oh, JS; Bae, ED; Kim, Seung-Woo, EUSPEN, pp.314 - 315, 2004-05-06 |
Space Radiation Effects on a Semiconductor Saturable Absorber Kim, Seung-Woo; Jang, Yoonsoo; Lee, Joohyung; Lee, Keunwoo; Han, Seongheum; Kim, Young-Jin; Kim, Seung-man, CLEO-PR &OECC/PS 2013, CLEO-PR &OECC/PS 2013, 2013-06-30 |
Stable Lateral-Shearing Interferometer for Production Line inspection of Aspheric Lenses Kim, Seung-Woo, International Precision Engineering Seminar, 1997-01-01 |
State-of-the-art of the laser interferometers for displacement measurement Oh, J.S.; Kim, Seung-Woo, Proceedings of Korea-Japan Joint Symposium on Nanoengineering 2003, pp.107 - 107, 2003 |
State-of-the-art of the Laser Interferometers for Displacement Measurement, KIM SEUNG WOO, 한국정밀공학회 한일심포지움, pp.107 - 114, 2003-11-27 |
Statistical analysis on measuring resolution of edge position by digital imaging Kim, Seung-Woo; Lee S.Y.; Lee J.K., Ultrahigh- and High-Speed Photography and Image-based Motion Measurement, v.3173, pp.306 - 316, 1997-07-28 |
Surface metrology of silicon wafers using a femtosecond pulse laser Kwon T.; Joo K.-N.; Kim, Seung-Woo, Interferometry XIV: Techniques and Analysis, 2008-08-11 |
The Analysis and Compensation of 2D Position Error in Scanning Type XY Stage Oh, JS; Bae, ED; Kim, Seung-Woo, JSPE, pp.231 - 233, 2004-06 |
The Analysis and Compensation of Position Error in Scanning Type XY Stage from Motion Error Measurement Hwang, J.H.; Park, C.H.; Lee, C.H.; Kim, Seung-Woo, ASPE 2004 Annual Meeting, pp.0 - 0, 2004-10 |
The estimation of 2D position and flatness errors for a planar XY stage from profiles measurement of guide-ways Hwang, J.; Park, C.H.; Kim, Seung-Woo, The 2nd International Conference on Positioning Technology, pp.134 - 138, The 2nd International Conference on Positioning Technology, 2006-12 |
Three-dimensional profile measurement of fine objects by phase-shifting shadow moir챕 interferometry Kim, Seung-Woo; Choi Y.-B.; Oh J.-T., Three-Dimensional Imaging and Laser-Based Systems for Metrology and Inspection II, v.2909, pp.28 - 36, 1996-11-20 |
Two-point diffraction interferometer for absolute distance measurement Kim, Seung-Woo; Rhee H.-G.; Joo J.-Y.; Kim Y.-J., Interferometry XII: Techniques and Analysis, v.5531, pp.162 - 169, 2004-08-02 |
Ultra precision fabrication of plasmonic nano waveguide using focused ion beam milling Kim, Seung-Woo; Kim, S; Park, IY; Choi, J, the 10th International Symposium on Measurement Technology and Intelligent Instruments, International Symposium on Measurement Technology and Intelligent Instruments, 2011-06-29 |
Ultrafast Optics for Ultra-Precision in Manufacturing 김승우, 한국광학회 2010년도 동계학술대회, 한국광학회, 2010-01 |
Ultrafast Photonics for Ultra-Precision Kim, Young Jin; Kim, Seung-Woo, NAP International Workshop, NAP International Workshop, 2014-02 |
Very large scale phase measuring interferometry for profile measurement of aspheric surfaces with nanometer accuracy Kim, Seung-Woo; Chang In-Chul; Kim Dong-Sik; Kim Tae-Ho; Yoo Seung-Bong, Proceedings of the 1999 Pacific Rim Conference on Lasers and Electro-Optcis (CLEO/PACIFIC Rim '99), v.1, pp.70 - 71, 1999-08-30 |
Vibration-insensitive Fiber-diffraction Interferometer for Testing Large Scale Optics Kwon, T.; Kihm, H.; Kim, Seung-Woo, Proceedings of the 6th euspen International Conference, pp.50 - 54, 2006-05 |
Visibility optimization of phase-shifting diffraction-grating interferometer Hwang T.-J.; Kim, Seung-Woo, Interferometry XII: Techniques and Analysis, v.5531, pp.383 - 394, 2004-08-02 |
Volumetric Interferometer for 3-D Coordinate Measurement Kim, Seung-Woo; Chu, J; Rhee, HG, EUSPEN, pp.234 - 235, 2004-05-06 |
Volumetric interferometer for nano-scale coordinate metrology Chu, J; Kim, Seung-Woo, 한국정밀공학회 한일심포지움, pp.328 - 331, 2003-11-27 |
Zonal scanning optical figure metrology for large aspheric surfaces Park, SR; Kihm, H; Kim, Seung-Woo, 한국정밀공학회 한일심포지움, pp.297 - 307, 2003-11-27 |
가간섭 EUV 생성을 위한 미세 패턴의 설계 및 제작 진종한; 김승철; 박인용; 김승우, 한국정밀공학회 2008년도 춘계학술대회 , pp.127 - 128, 한국정밀공학회, 2008-06-11 |
가상의 백색광 주사 간섭계의 개발 김영식; 김승우, 한국광학회 제14회 정기총회 및 2003년도 동계학술발표회 , pp.88 - 89, 한국광학회, 2003-02-13 |
간섭계용 헬륨-네온 레이저의 주파수 안정화 주기남; 김승우, 한국정밀공학회 2003년 춘계학술대회, v.3, pp.260 - 263, 한국정밀공학회, 2003 |
갈륨의 고정점을 이용한 정밀 온도제어 김태호; 김승우, 한국정밀공학회 2002년도 추계학술대회 , v.2, pp.351 - 354, 한국정밀공학회, 2002 |
거리 및 형상 측정을 위한 펨토초 레이저의 주파수 안정화 김영진; 진종한; 김승우, 한국정밀공학회 2005년도 추계학술대회 , v.5, pp.188 - 191, 한국정밀공학회, 2005-10 |
경사단면 단일모드 광섬유로부터의 자유 공간 회절 김학용; 김승우, 한국광학회 2004년도 하계학술발표회 , pp.248 - 249, 한국광학회, 2004-07-08 |
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