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Rapid defect inspection of display devices with optical spatial filtering Kim, Seung-Woo; Yoon Dong-Seon, Proceedings of the 1999 Optical Measurement Systems for Industrial Inspection, pp.255 - 261, SPIE, 1999-06-16 |
Rapid pattern inspection of shadow masks by machine vision integrated with Fourier optics Kim, Seung-Woo; Lee Sang-Yoon; Yoon Dong-Seon; Hong Chul-Ki; Hong Ji-Jung, Proceedings of the 1997 Display Manufacturing Technology Conference, pp.19 - 20, 1997-01-29 |
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