Browse "Dept. of Mechanical Engineering(기계공학과)" by Author 186
Showing results 83 to 142 of 320
| Improvement of Temperature Induced Measuring Error in the Positioning Error Measurement of the Ultra Precision Stages Hwang, J.H.; Park, C.H.; Lee, C.H.; Kim, Seung-Woo, International Conference on Leading Edge Manufacturing in 21st Century, pp.541 - 541, 2003-11-03 |
| Large Optics Testing with a New Anti-vibration Interferometer Kim, Seung-Woo; H.Y.Kim, Proc. of Nanoengineering Symposium, pp.173 - 176, 2005 |
| Laser Autocollimation을 이용한 디지탈 조도 측정 시스템의 입사 광속의 최적 스폿 크기 임동열; 김승우, 대한기계학회 1989년 춘추학술대회, pp.105 - 108, 대한기계학회, 1989 |
| Laser ranging by time-of-flight measurement of femtosecond light pulses Kim, Young Jin; Kim, Seung-Woo, International Colloquium at Haute-Provence Observatory, Observatoire de Haute-Provence (OHP), 2013-09-26 |
| Lateral-Shearing Interferometer for Optical Testing of Aspheric Optical Pick-up Lenses Kim, Seung-Woo, Proc. of the 1st Asian Pacific Laser Symposium, 1998 |
| Linewidth Measurement of Wafers using SEM and its Uncertainty Evaluation Kim, Seung-Woo; Ko, YU; Eom, TB; Kim, KH, SPIE , 1996 |
| Long distance measurement with sub-femtosecond timing resolution for formation-flying satellite missions Lee J.; Kim, Young Jin; Lee S.; Lee G.; Kim, Seung-Woo, 60th International Astronautical Congress 2009, IAC 2009, v.6, pp.4916 - 4924, 2009-10-12 |
| Low coherence interferometry for 3-D measurements of microelectronics packaging and integration Kim, Seung-Woo; Ghim Y.-S., Optoelectronic Devices and Integration, v.5644, pp.429 - 443, 2004-11-08 |
| Low-coherence interferometry over a wide field-of-view by sweeping the repetition rate of femtosecond light pulses Kim, Seung-Woo; Kim, Young Jin; Joo, Woo-Deok; Kim, Seungman; Park, Jiyong, ASPEN 2013, ASPEN 2013, 2013-11-15 |
| Measurement Uncertainty Limit of a Video Probe in Coordinate Metrology Kim, Seung-Woo, the Annals of CIRP, pp.493 - 496, 1996 |
| Meso-scale 3-D Form Profile Measurements : White-light Scanning Interferometry vs. Moir? Interferometry Kim, Seung-Woo, 2004 ICO International Conference on Optics & Photonics in Technology Frontier, pp.12 - 15, 2004 |
| Metrological atomic force microscope using volumetric interferometer Jin, J; Rhee, HG; Kim, Seung-Woo, 한국정밀공학회 한일심포지움, pp.313 - 316, 2003-11-27 |
| Multi-Axis Dual-Servo Control of an XYQ- Stage for Ultraprecision Positioning Over Long Travel Kim, Seung-Woo; Lee, C.W.; Oh, J.K.; Lee, H.S., Proceedings of International Federation of Automatic Control, pp.347 - 353, 1995 |
| Multi-channel Optical Frequency Generator for Absolute Distance Measuremen 김승우, The 4th International Conference on Positioning Technology, The 4th International Conference on Positioning Technology, 2010-11 |
| Nano global positioning system Kim, Seung-Woo; Rhee, HG; Chu, JY; Kim, Y, Proceedings of the 1st International Conference on Positioning Technology, pp.61 - 66, jspe, kspe, 2004-06 |
| Nanometrology Using Femtosecond Lasers Kim, Seung-Woo; Joo, KN, The 2nd International Symposium on Nanomanufacturing 2004, pp.118 - 121, 2004-11 |
| Nanoscale fabrication through local field enhanced femtosecond pulse laser and AFM Kim, Seung-Woo; S.C.Kim, ASPEN, 2007, 2007 |
| New design of precision CMM based on phase-measuring volumetric interferometry Kim, Seung-Woo, Annals of CIRP, Vol.51/1, pp.357 - 360, 2001 |
| New Insights on XUV Generation from Bowtie and Funnel-waveguide Nano Structures Kim, Seung-Woo, Workshop on EUV generation from plasmonic field enhancement, Workshop on EUV generation from plasmonic field enhancement, 2014-06 |
| New Possibilities of Femtosecond Lasers for Advanced Metrology in Space Missions Kim, Seung-Woo, 2013 International Symposium on Optomechatronic Technologies, 2013 International Symposium on Optomechatronic Technologies, 2013-10-28 |
| New Precision Dimensional Metrology using Femtosecond Pulse Lasers Kim, Seung-Woo; Oh , J.S.; Jin, J.; Joo, K.N.; Kim, Y.J., Proceeding of the Euspen 5 th International Conference, pp.135 - 138, 2005-05 |
| Nonparaxial Fresnel diffraction from oblique end facets of optical fibers Kihm H.; Kim, Seung-Woo, Optical Design and Testing II - SPIE, v.5638, pp.517 - 524, 2004-11-08 |
| Numerical analysis of plasmonic nanodevice for coherent extreme-ultraviolet light generation Kim, Seung-Woo, the 10th International Symposium on Measurement Technology and Intelligent Instruments, International Symposium on Measurement Technology and Intelligent Instruments, 2011-06-29 |
| Oblique point-diffraction source for interferometer design Kihm H.; Kim, Seung-Woo, Optical Measurement Systems for Industrial Inspection III, v.5144, pp.240 - 249, 2003-06-23 |
| On-Line Measurement of Surface Roughness by Light Scattering Kim, Seung-Woo, 1990 Japan-U.S.A. Symposium on Flexible Automation, ISCIE, pp.703 - 706, 1990 |
| On-machine surface profile metrology for large-scale optics Kim, Seung-Woo; Park, J.J.; Kwon, T.M.; You, J.H.; Kihm, H.Y., ASPEN 2007, 2007 |
| On-machine surface profile metrology for large-scale optics Kim, Seung-Woo, KAIST-NTU Student Workshop, KAIST-NTU, 2007-02 |
| On-machine surface profile metrology for Polishing large-scale Opitcs Khim, H.; Park, J.; Kwon, T.; You, J.; Kim, Seung-Woo, The 2nd International Conference on Positioning Technology, pp.141 - 145, 2006 |
| Opti - Phase® OCR 모듈을 이용한 OCT 시스템 개발 오정택; 황인덕; 윤길원; 김승우, 한국광학회 제14회 정기총회 및 2003년도 동계학술발표회 , pp.294 - 295, 한국광학회, 2003 |
| Optical Coherence Tomography of Silicon Wafers using a Femtosecond Pulse Laser Kim, Seung-Woo; Kwon,T.M.; Joo, K.N., ASPEN2007, 2007 |
| Optical Frequency Generator for Absolute Distance Measurement Kim, Seung-Woo; Kim, Y.J.; Jin, J.H.; Kim, Y.S.; Hyun, S.W., ASPEN 2007, 2007 |
| Optical Frequency Generators for Absolute Distance Measurement Kim,Y.J.; Jin, J.; Kim, Y.; Hyun, S.; Kim, Seung-Woo, KAIST Kyushu Univ. Joint Seminar 2008, KAIST Kyushu Univ., 2008-09 |
| Optical Frequency Synthesizer Based on a Femtosecond Pulse Laser Kim,Y.; Jin ,J.; Kim, Y.J.; Kim, Seung-Woo, KAIST-NMIJ Joint Workshop 2006 on Precision Metrology, pp.10 -, 2006-12 |
| Optimal Design Methodology of Servo Systems for Point-To-Point Control Kim, Seung-Woo, Proc. of the Int'l Conf. on Advanced Mechatronics, pp.59 - 65, 1991-10-08 |
| Phase Measuring Volumetric Interferometry for Three-Dimensional Coordinate Metrology Kim, Seung-Woo, Proc. of 2nd Euspen International Conference, Turin, pp.230 - 233, 2001-01-01 |
| Phase-measuring volumetric interferometer for three-dimensional coordinate metrology Kim, Seung-Woo; Rhee, H.G.; Chu, J.Y., ASPE Annual Meeting, pp.411 - 414, 2002 |
| Phase-shifitng projection moire for out-of-plane displacement measurement Jeong, M.S.; Kim, Seung-Woo, Proceedinfs of SPIE Vol. 4317, pp.170 - 179, 2000 |
| Phase-shifting diffraction grating interferometer for testing concave mirrors Hwang T.-J.; Kim, Seung-Woo, Optical Measurement Systems for Industrial Inspection III, v.5144, pp.451 - 459, 2003-06-23 |
| Phase-shifting projection moir챕 for out-of-plane displacement measurement Jeong M.-S.; Kim, Seung-Woo, 2nd International Conference on Experimental Mechanics, v.4317, pp.170 - 179, 2000-11-29 |
| Pitch measurement and calibration using atomic force microscope Jin, J; Kim, SC; Kim, Seung-Woo, 한국정밀공학회 한일심포지엄, pp.313 - 316, 2003-11-27 |
| Plasmonic field enhancement for generating ultrafast extreme-ultraviolet light pulses Kim, Seung-Woo, SPIE 2011 Optics+Photonics, SPIE 2011 Optics+Photonics, 2011-08-21 |
| Point diffraction interferometer with vibratinn desensitizing Capability You, J.; Park, J.; Kwon, T.; Khim, H.; Kim, Seung-Woo, KAIST-NMIJ Joint Workshop 2006 on Precision Metrology, pp.29 -, 2006-12 |
| Point-diffraction fiber interferometer for vibration desensitization Park J.; Kihm H.; Kim, Seung-Woo, Optical Measurement Systems for Industrial Inspection IV, pp.922 - 929, 2005-06-13 |
| Point-Diffraction Interferometer for 3-D Profile Measurement of Rough Surfaces Kim, Seung-Woo; Kim B.-C., Optical Diagnostics for Fluids, Solids, and Combustion II, v.5191, pp.200 - 207, 2003-08-03 |
| PRECISE MEASUREMENT OF REFRACTIVE INDEX AND THE THICKNESS OF A MATERIAL BY DISPERSIVE INTERFEROMETRY USING A FEMTOSECOND PULSE LASER Kim, Seung-Woo, KAIST-TIT Student Workshop, KAIST-TIT Student Workshop, 2007-02 |
| Precision laser ranging using femtosecond light pulses Kim, Seung-Woo, ISPEMI2011, ISPEMI, 2011-08-07 |
| Precision length metrology based on optical frequency synthesizer Jin J.; Kim, Young Jin; Kim Y.; Hyun S.; Kim, Seung-Woo, 2007 Conference on Lasers and Electro-Optics - Pacific Rim, CLEO/PACIFIC RIM, 2007-08-26 |
| Precision Length Metrology using an Optical Frequency Generator Kim, Seung-Woo; Jin, J.H.; Kim, Y.J.; Kim, Y.S.; Hyun, S.W., ASPEN 2007, 2007 |
| Precision Length Metrology using Optical Comb of the Femtosecond Pulse Laser Kim, Seung-Woo, ROK-PRC Optics Technology Workshop, pp.0 - 0, 2006-03 |
| Precision Length Metrology using Optical Frequency Synthesizer Kim, Seung-Woo; J. Jin; Y. J. Kim; Y. Kim; S. Hyun, CLEO-PR(Pacific Rim), 2007 |
| Precision Length Metrology using the Optical Comb of Femtosecond Pulse Lasers Kim, Seung-Woo, 2005 Engineering graduated student symposium, pp.37 - 37, 2005-11 |
| Precision Length Metrology usting the Optical comb of Femtosecond Pulse Lasers Jin, J; Kim, YJ; Kim, Seung-Woo, nanoengineering symposium 2005, pp.192 - 197, 2005-10-26 |
| Precision Measurement of Aspheric Surfaces by Improved Ronchi Test Kim, Seung-Woo; Lee, H.J.; Lim, S.E., Proc. of ASPE 1997 Annual Meeting, 1997 |
| Precision Metrology for Space Missions using Femtoseccond Laser Pulses Kim, Seung-Woo, ASPEN 2011, ASPEN, 2011-11-16 |
| Precision Profile Measurement of Aspheric Surfaces by Improved Ronchi Test Kim, Seung-Woo, Proc. of ASPE 1997 Annual Meeting, 1997 |
| Precision surface profile measurement using femtosecond pulse laser Kim, Seung-Woo, the 10th International Symposium on Measurement Technology and Intelligent Instruments, International Symposium on Measurement Technology and Intelligent Instruments, 2011-06-29 |
| Precision surface profile measurements by comb-based multi-wavelength interferometry Kim, Seung-Woo; Choi, Minah; Hyun, Sangwon; Chun, Byung Jae; Kim, Seungman; Kim, Young Jin, CLEO-PR &OECC/PS 2013, CLEO-PR &OECC/PS 2013, 2013-06-30 |
| Production Line Inspection of Precision Surfaces by Phase-Shifting Interferometry with Automatic Suppression of Phase Shift Errors Kim, Seung-Woo, Proc. of the 8th International Precision Engineering Seminar, pp.45 - 48, 1995-05-15 |
| Rapid pattern inspection of shadow masks by machine vision integrated with Fourier optics Kim, Seung-Woo; Lee Sang-Yoon; Yoon Dong-Seon; Hong Chul-Ki; Hong Ji-Jung, Proceedings of the 1997 Display Manufacturing Technology Conference, pp.19 - 20, 1997-01-29 |
| Real time precision measurement of the absolute distances using the multi-channel optical frequency generator Kim, Seung-Woo; Hyun, Sangwon; Kim, Young Jin; Chun, Byung Jae, ASPEN 2013, ASPEN 2013, 2013-11-15 |
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