Browse "Dept. of Mechanical Engineering(기계공학과)" by Subject INTERFEROMETRY
Showing results 10 to 21 of 21
| Massively parallel electro-optic sampling of space-encoded optical pulses for ultrafast multi-dimensional imaging Na, Yongjin; Kwak, Hyunsoo; Ahn, Changmin; Lee, Seung Eon; Lee, Woojin; Kang, Chu-Shik; Lee, Jungchul; et al, LIGHT-SCIENCE & APPLICATIONS, v.12, no.1, 2023-02 |
| Measurement of the thickness profile of a transparent thin film deposited upon a pattern structure with an acousto-optic tunable filter Kim, D; Kim, Soohyun; Kong, Hong-Jin; Lee, Y, OPTICS LETTERS, v.27, no.21, pp.1893 - 1895, 2002-11 |
| Open-Air Testing of Dual-Comb Time-of-Flight Measurement Kim, Wooram; Yang, Jaewon; Jang, Jaeyoung; Oh, Jeong Seok; Han, Seongheum; Kim, Seungman; Jang, Heesuk; et al, SENSORS, v.23, no.21, 2023-11 |
| Optical inspection of complex patterns of microelectronics products You, J.; Kim, Seung-Woo, CIRP ANNALS-MANUFACTURING TECHNOLOGY, v.57, no.1, pp.505 - 508, 2008 |
Parallel determination of absolute distances to multiple targets by time-of-flight measurement using femtosecond light pulses Han, Seongheum; KIM, Young-Jin; Kim, Seung-Woo, OPTICS EXPRESS, v.23, no.20, pp.25874 - 25882, 2015-10 |
| Peak movement detection method of an equally spaced fringe for precise position measurement Yi, JH; Kim, Soohyun; Kwak, YK; Lee, YW, OPTICAL ENGINEERING, v.41, no.2, pp.428 - 434, 2002-02 |
| Phase-shifting grating projection moire topography Choi, YB; Kim, Seung-Woo, OPTICAL ENGINEERING, v.37, no.3, pp.1005 - 1010, 1998-03 |
| Real-time compensation of the refractive index of air in distance measurement Kang, Hyun Jay; Chun, Byung-Jae; Jang, Yoon-Soo; KIM, Young-Jin; Kim, Seung-Woo, OPTICS EXPRESS, v.23, no.20, pp.26377 - 26385, 2015-10 |
| Simultaneous 3-D Surface Profiling of Multiple Targets by Repetition Rate Scanning of a Single Femtosecond Laser Lu, Yang; Park, Jiyong; Bian, Dian; Yu, Liandong; Kim, Seung-Woo, INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, v.21, no.2, pp.211 - 217, 2020-02 |
| Solder reflow process induced residual warpage measurement and its influence on reliability of flip-chip electronic packages Yang, SY; Jeon, YD; Lee, Soon-Bok; Paik, Kyung-Wook, MICROELECTRONICS RELIABILITY, v.46, pp.512 - 522, 2006-02 |
| Theoretical Considerations on Combined Optical Distance Measurements Using a Femtosecond Pulse Laser Joo, Ki-Nam; Kim, Seung-Woo, JOURNAL OF THE OPTICAL SOCIETY OF KOREA, v.16, no.4, pp.396 - 400, 2012-12 |
| White light on-axis digital holographic microscopy based on spectral phase shifting Kim, D; You, JW; Kim, Soohyun, OPTICS EXPRESS, v.14, no.1, pp.229 - 234, 2006-01 |
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