Browse "Dept. of Mechanical Engineering(기계공학과)" by Author 186
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| Design and fabrication of plasmonic nanostructure for high harmonic generation Kim, Seung-Woo, SPIE Optics & Photonics 2009, SPIE Optics & Photonics 2009, 2009-08-01 |
| Design of a Fizeau interferometer and self-calibration of system errors for testing of large optics Kim, H.Y.; Kim, Seung-Woo; Kim, B.C., Korea-China Joint workshop on design, manufacturing, testing and alignment of large optics, 2001 |
| Design of an Ultraprecision Stepping Stage for Lithography of Next Generation Integrated-Circuit Chips Kim, Seung-Woo; Park, S.H; Lee, C.W., Ultraprecision Manufacturing Engineering 3, pp.39 - 42, 1994 |
| Design of non-thermal dicing system for quartz wafers Han, S; Kim, Y; Kim,YJ; Kim, S; Park, S; Park, J; Kim, Seung-Woo, the10th International Symposium on Measurement Technology and Intelligent Instruments, International Symposium on Measurement Technology and Intelligent Instruments, 2011-06-29 |
| Development of Aerostatic Stage for Vacuum Environment The 1st International Conference on Positioning Technology Kim, Seung-Woo; Kim, K.H.; Lee, H.S., The 1st International Conference on Positioning Technology, pp.477 - 478, 2004 |
| Development of Fiber Femtosecond Lasers for Advanced Metrological Space Missions Kim, Seung-Woo; Kim, Young Jin; Lee, Keunwoo; Han, Seongheum; Jang, Yoonsoo; Jang, Heesuk, CLEO-PR &OECC/PS 2013, CLEO-PR &OECC/PS 2013, 2013-06-30 |
| Direct inscription of fiber Bragg grating by high power femtosecond pulse laser Park, S; Kim,YJ; Kim, Y; Kim, S; Han, S; Kim, Seung-Woo, the 10th International Symposium on Measurement Technology and Intelligent Instruments, International Symposium on Measurement Technology and Intelligent Instruments, 2011-06-29 |
| Direct Measurement of Spindle Radial Accuracy by Moire Topography Kim, Seung-Woo, Proc. of the 7th International Precision Engineering Seminar, pp.441 - 450, 1993-05 |
| Dispersive Interferometry A-Challenging Direction for New Optical Metrology Kim, Seung-Woo; Joo, K.N.; Ghim,Y.S., 5th International Conference on Optics-Photonics Design & Fabrication (ODF'06), pp.309 - 310, 2006-12-06 |
| Dispersive interferometry using a femtosecond pulse laser Joo, KN; Kim, Seung-Woo, KAIST-NMIJ Joint Workshop 2006 on Precision Metrology, pp.13 -, 2006-12 |
| Dispersive white-light interferometrt for thin-film thickness profile measurement Kim, Seung-Woo; Y.S.Ghim, SPIE, pp.419 - 426, 2005 |
| Dispersive white-light interferometry for 3-D inspection of thin-film layers of flat panel displays Kim, Seung-Woo; Y.S.Ghim; J.You, Proc.of SPIE, pp.6616 -, 2007 |
| Dispersive White-light Interferometry for 3-D Inspection of Thin-Film Layers of Flat Panel Displays Ghi, YS; Park, J; Kim, Seung-Woo, Proceedings of the 6th euspen International Conference, pp.0 - 0, 2006-05 |
| Dispersive white-light interferometry for thin-film thickness profile measurements Ghim, Y.S.; Kim, Seung-Woo, KAIST-NMIJ Joint Workshop 2006 on Precision Metrology, pp.22 -, 2006-12 |
| Distance Metrology for Space Missions using Femtosecond Laser Pulses Kim, Y.J.; Kim,Y.; Lee, J.; Hyun, S.; Chun, B.J.; Kim, S.; Lee, K.; et al, EOS (European Optical Society) Annual Meeting 2010, EOS (European Optical Society) Annual Meeting 2010, 2010-10 |
| EMBR을 이용한 연주공정에서의 난류유동 및 응고해석 김덕수; 김승우, 대한기계학회 1998년 춘추학술대회 , v.1, no.2, pp.235 - 240, 대한기계학회, 1998 |
| Error propagation in calibration of E-beam lithography stages Yoo S.; Kim, Seung-Woo, Photomask and Next-Generation Lithography Mask Technology X, v.5130, pp.339 - 346, 2003-04-16 |
| Femtosecond laser pulses for surface profile metrology Oh, J.S.; Kim, Seung-Woo, KAIST-NMIJ Joint Workshop 2006 on Precision Metrology, pp.14 -, 2006-12 |
| Fiber-based frequency comb with mHz relative linewidth carrier-envelope- offset frequency Kim Y.; Kim S.; Kim Y.-J.; Kim, Seung-Woo, Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010, Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010, 2010-05-16 |
| Field enhancement by plasmon resonance in metallic nanostructures for high harmonic generation Kim, Seung-Woo, International Symposium on Ultrafast Intense Laser Science (ISUILS7), International Symposium on Ultrafast Intense Laser Science (ISUILS7), 2008-11-01 |
| Generation of EUV pulses by plasmonic field enhancement Kim, Seung-Woo, SPP5, SPP5, 2011-05-15 |
| Generation of EUV Radiation by Plasmonic Field Enhancement Kim, Seung-Woo; Park, In-Yong; Choi, Joonhee; Lee, Joohyung; Han, Seongheum; Kim, Seungchul, JSAP-OSA Joint Symposia, JSAP-OSA Joint Symposia, 2012-09 |
| Generation of multiple optical frequencies out of the frequency comb of a femtosecond laser Kim, Seung-Woo; Hyun, Sangwon; Kim, Young Jin; Chun, Byung Jae, ISMTII2013, ISMTII2013, 2013-07-03 |
| Grating projection moire interferometry for high speed 3-D inspection of meso-scale objects Lee S.-Y.; Kang M.-G.; Kim, Seung-Woo, Optical Measurement Systems for Industrial Inspection V, no.PART 1, pp.180 - 183, 2007-06-18 |
| Heterodyne Volumetric Interferometer KIM SEUNG WOO, 한국정밀공학회, pp.344 - 347, 2004-05-01 |
| High harmonic generation by localized plasmon resonance in metal nanostructure Kim, Seung-Woo, 4th Asian Symposium on Intense Laser Science (ASILS4), 4th Asian Symposium on Intense Laser Science (ASILS4), 2008-11-03 |
| High Harmonic Generation by Plasmonic Enhancement of Femtosecond Laser Pulses Kim, Seung-Woo, 33rd Annual Meeting of NNV-AMO (33rd Annual conference of the Division Atomic, Molecular, and Optical Physics), 33rd Annual Meeting of NNV-AMO, 2009-10-06 |
| High Harmonic Generation using Enhanced field by Loclized Surface Plasmon Resonance 김승우, 양자광학워크샵 2008, 양자광학워크샵 2008, 2008-12-21 |
| High harmonics generation by plasmonic field enhancement Kim, Seung-Woo; Kim S.; Park I.-Y.; Jin J., Plasmonics: Metallic Nanostructures and Their Optical Properties VII, v.7394, 2009-08-02 |
| High Order Harmonic Generation by Locally Enhanced Near-field Effect Kim, Seung-Woo, KAIST Kyushu Univ. Joint Seminar 2008, KAIST Kyushu Univ. Joint Seminar 2008, 2008-09 |
| High order harmonic generation with enhanced near-field by localized surface plasmon Kim S.; Park I.-Y.; Choi J.; Jin J.; Kim, Seung-Woo, 2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum Electronics and Laser Science Conference, CLEO/QELS 2009, 2009-06-02 |
| High power fiber femtosecond laser for generating frequency comb in EUV regime Kim, Seung-Woo, 4th Asian Symposium on Intense Laser Science (ASILS4), 4th Asian Symposium on Intense Laser Science (ASILS4), 2008-11-01 |
| High power Yb-fiber femtosecond laser based on chirped pulse amplification Kim, Y.; Kim, Y.J.; Kim, S.; H. Hussein; Kim, Seung-Woo, 4th Asian Symposium on Intense Laser Science (ASILS4), 4th Asian Symposium on Intense Laser Science (ASILS4), 2008-11 |
| High Precision Laser Ranging by Time-of-flight measurement of Femtosecond Pulses Kim, Seung-Woo; Lee, Joohyung; Han, Seongheum; Lee, Keunwoo; Kim, Young Jin, ICPT 2012, ICPT 2012, 2012-11 |
| High repetition rate extreme ultraviolet pulse generation with field enhancement Park, IY; Kim, S; Choi, JH; Kim, Seung-Woo, the 10th International Symposium on Measurement Technology and Intelligent Instruments, International Symposium on Measurement Technology and Intelligent Instruments, 2011-06-29 |
| High-resolution time-of-flight measurement using a femtosecond pulse laser Lee, J; Kim, YJ; Lee, K; Lee, SH; Kim, Seung-Woo, the 10th International Symposium on Measurement Technology and Intelligent Instruments, International Symposium on Measurement Technology and Intelligent Instruments, 2011-06-29 |
| High-resolution time-of-flight measurement using a femtosecond pulse laser Lee, J; Kim, YJ; Lee, K; Lee, SH; Kim, Seung-Woo, The 4th International Conference on Positioning Technology (ICPT), The 4th International Conference on Positioning Technology, 2010-11 |
| Improvement of Temperature Induced Measuring Error in the Positioning Error Measurement of the Ultra Precision Stages Hwang, J.H.; Park, C.H.; Lee, C.H.; Kim, Seung-Woo, International Conference on Leading Edge Manufacturing in 21st Century, pp.541 - 541, 2003-11-03 |
| Large Optics Testing with a New Anti-vibration Interferometer Kim, Seung-Woo; H.Y.Kim, Proc. of Nanoengineering Symposium, pp.173 - 176, 2005 |
| Laser Autocollimation을 이용한 디지탈 조도 측정 시스템의 입사 광속의 최적 스폿 크기 임동열; 김승우, 대한기계학회 1989년 춘추학술대회, pp.105 - 108, 대한기계학회, 1989 |
| Laser ranging by time-of-flight measurement of femtosecond light pulses Kim, Young Jin; Kim, Seung-Woo, International Colloquium at Haute-Provence Observatory, Observatoire de Haute-Provence (OHP), 2013-09-26 |
| Lateral-Shearing Interferometer for Optical Testing of Aspheric Optical Pick-up Lenses Kim, Seung-Woo, Proc. of the 1st Asian Pacific Laser Symposium, 1998 |
| Linewidth Measurement of Wafers using SEM and its Uncertainty Evaluation Kim, Seung-Woo; Ko, YU; Eom, TB; Kim, KH, SPIE , 1996 |
| Long distance measurement with sub-femtosecond timing resolution for formation-flying satellite missions Lee J.; Kim, Young Jin; Lee S.; Lee G.; Kim, Seung-Woo, 60th International Astronautical Congress 2009, IAC 2009, v.6, pp.4916 - 4924, 2009-10-12 |
| Low coherence interferometry for 3-D measurements of microelectronics packaging and integration Kim, Seung-Woo; Ghim Y.-S., Optoelectronic Devices and Integration, v.5644, pp.429 - 443, 2004-11-08 |
| Low-coherence interferometry over a wide field-of-view by sweeping the repetition rate of femtosecond light pulses Kim, Seung-Woo; Kim, Young Jin; Joo, Woo-Deok; Kim, Seungman; Park, Jiyong, ASPEN 2013, ASPEN 2013, 2013-11-15 |
| Measurement Uncertainty Limit of a Video Probe in Coordinate Metrology Kim, Seung-Woo, the Annals of CIRP, pp.493 - 496, 1996 |
| Meso-scale 3-D Form Profile Measurements : White-light Scanning Interferometry vs. Moir? Interferometry Kim, Seung-Woo, 2004 ICO International Conference on Optics & Photonics in Technology Frontier, pp.12 - 15, 2004 |
| Metrological atomic force microscope using volumetric interferometer Jin, J; Rhee, HG; Kim, Seung-Woo, 한국정밀공학회 한일심포지움, pp.313 - 316, 2003-11-27 |
| Multi-Axis Dual-Servo Control of an XYQ- Stage for Ultraprecision Positioning Over Long Travel Kim, Seung-Woo; Lee, C.W.; Oh, J.K.; Lee, H.S., Proceedings of International Federation of Automatic Control, pp.347 - 353, 1995 |
| Multi-channel Optical Frequency Generator for Absolute Distance Measuremen 김승우, The 4th International Conference on Positioning Technology, The 4th International Conference on Positioning Technology, 2010-11 |
| Nano global positioning system Kim, Seung-Woo; Rhee, HG; Chu, JY; Kim, Y, Proceedings of the 1st International Conference on Positioning Technology, pp.61 - 66, jspe, kspe, 2004-06 |
| Nanometrology Using Femtosecond Lasers Kim, Seung-Woo; Joo, KN, The 2nd International Symposium on Nanomanufacturing 2004, pp.118 - 121, 2004-11 |
| Nanoscale fabrication through local field enhanced femtosecond pulse laser and AFM Kim, Seung-Woo; S.C.Kim, ASPEN, 2007, 2007 |
| New design of precision CMM based on phase-measuring volumetric interferometry Kim, Seung-Woo, Annals of CIRP, Vol.51/1, pp.357 - 360, 2001 |
| New Insights on XUV Generation from Bowtie and Funnel-waveguide Nano Structures Kim, Seung-Woo, Workshop on EUV generation from plasmonic field enhancement, Workshop on EUV generation from plasmonic field enhancement, 2014-06 |
| New Possibilities of Femtosecond Lasers for Advanced Metrology in Space Missions Kim, Seung-Woo, 2013 International Symposium on Optomechatronic Technologies, 2013 International Symposium on Optomechatronic Technologies, 2013-10-28 |
| New Precision Dimensional Metrology using Femtosecond Pulse Lasers Kim, Seung-Woo; Oh , J.S.; Jin, J.; Joo, K.N.; Kim, Y.J., Proceeding of the Euspen 5 th International Conference, pp.135 - 138, 2005-05 |
| Nonparaxial Fresnel diffraction from oblique end facets of optical fibers Kihm H.; Kim, Seung-Woo, Optical Design and Testing II - SPIE, v.5638, pp.517 - 524, 2004-11-08 |
| Numerical analysis of plasmonic nanodevice for coherent extreme-ultraviolet light generation Kim, Seung-Woo, the 10th International Symposium on Measurement Technology and Intelligent Instruments, International Symposium on Measurement Technology and Intelligent Instruments, 2011-06-29 |
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