Robust regression to varying data distribution and its application to landmark-based localization
- Publisher
- IEEE
- Issue Date
- 2008-10-12
- Language
- English
- Citation
2008 IEEE International Conference on Systems, Man and Cybernetics, SMC 2008, pp.3465 - 3470
- Appears in Collection
- EE-Conference Papers(학술회의논문)
- Files in This Item
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