DC Field | Value | Language |
---|---|---|
dc.contributor.author | Shon, HK | ko |
dc.contributor.author | Lee, KB | ko |
dc.contributor.author | Kim, J | ko |
dc.contributor.author | Choi, Insung | ko |
dc.contributor.author | Moon, DW | ko |
dc.contributor.author | Lee, TG | ko |
dc.date.accessioned | 2009-11-19T08:36:53Z | - |
dc.date.available | 2009-11-19T08:36:53Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2006-07 | - |
dc.identifier.citation | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, v.24, no.4, pp.1203 - 1207 | - |
dc.identifier.issn | 0734-2101 | - |
dc.identifier.uri | http://hdl.handle.net/10203/12931 | - |
dc.description.abstract | A bismuth cluster ion-beam-based time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been successfully used to image micropatterns of streptavidin and Chinese hamster ovary (CHO-k1) cells. as received and without any labeling. Three different analysis ion beams (Bi+, Bi-3(+), and Bi-3(2+)) were compared to obtain label-free TOF-SIMS chemical images of micropatterns of streptavidin, which were subsequently used for generating biotinylated cell patterns. Unlike using a Bi' ion beam, using a Bi-3(+) or Bi-3(2+), primary analysis ion beam yielded well-contrasted-TOF-SIMS images of streptavidin characteristic secondary ions. A principal component analysis of TOF-SIMS data was performed to generate a chemical image of the streptavidin itself. A chemical specific TOF-SIMS image analysis gave us a better understanding of the localization of cells at the outer boundaries of the streptavidin-patterned circles. Our work suggests that using cluster-ion analysis beams together with multivariate data analysis for TOF-SIMS chemical imaging would be an effectual method for producing label-free chemical images of micropatterns of biomolecules, including proteins and cells. (c) 2006 American Vacuum Society. | - |
dc.language | English | - |
dc.language.iso | en_US | en |
dc.publisher | AMER INST PHYSICS | - |
dc.subject | ORGANIC THIN-FILMS | - |
dc.subject | BOMBARDMENT | - |
dc.subject | SURFACES | - |
dc.subject | PROTEIN | - |
dc.subject | BEAM | - |
dc.subject | SIMS | - |
dc.title | Time-of-flight secondary ion mass spectrometry chemical imaging analysis of micropatterns of streptavidin and cells without labeling | - |
dc.type | Article | - |
dc.identifier.wosid | 000239048100054 | - |
dc.identifier.scopusid | 2-s2.0-33745489487 | - |
dc.type.rims | ART | - |
dc.citation.volume | 24 | - |
dc.citation.issue | 4 | - |
dc.citation.beginningpage | 1203 | - |
dc.citation.endingpage | 1207 | - |
dc.citation.publicationname | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | - |
dc.embargo.liftdate | 9999-12-31 | - |
dc.embargo.terms | 9999-12-31 | - |
dc.contributor.localauthor | Choi, Insung | - |
dc.contributor.nonIdAuthor | Shon, HK | - |
dc.contributor.nonIdAuthor | Lee, KB | - |
dc.contributor.nonIdAuthor | Kim, J | - |
dc.contributor.nonIdAuthor | Moon, DW | - |
dc.contributor.nonIdAuthor | Lee, TG | - |
dc.type.journalArticle | Article; Proceedings Paper | - |
dc.subject.keywordPlus | ORGANIC THIN-FILMS | - |
dc.subject.keywordPlus | BOMBARDMENT | - |
dc.subject.keywordPlus | SURFACES | - |
dc.subject.keywordPlus | PROTEIN | - |
dc.subject.keywordPlus | BEAM | - |
dc.subject.keywordPlus | SIMS | - |
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